Abstract: An air deflection system has a first skirt assembly mounted to a vehicle at a first side of a cargo container thereon. The first skirt assembly has at least one upper panel and at least one lower panel each extending in a front-to-rear direction and having laterally facing air deflecting surfaces. The at least one lower panel is constructed to be more readily bendable than the at least one upper panel. The air deflection system further has a plurality of support braces extending angularly between: a) the underside of a vehicle to which the skirt assembly is operatively mounted; and b) the at least one upper panel to support the skit assembly on an associated vehicle and reinforce the at least one upper panel.

Abstract: An air deflection system has a first skirt assembly mounted to a vehicle at a first side of a cargo container thereon. The first skirt assembly has at least one upper panel and at least one lower panel each extending in a front-to-rear direction and having laterally facing air deflecting surfaces. The at least one lower panel is constructed to be more readily bendable than the at least one upper panel. The air deflection system further has a plurality of support braces extending angularly between: a) the underside of a vehicle to which the skirt assembly is operatively mounted; and b) the at least one upper panel to support the skit assembly on an associated vehicle and reinforce the at least one upper panel.

Abstract: A sequential semiconductor device tester, and in particular to a sequential semiconductor device tester is disclosed. In accordance with the sequential semiconductor device tester, a function of generating a test pattern data for a test of a semiconductor device and a function of carrying out the test are separated to sequentially test the semiconductor device, to maintain a signal integrity and to improve an efficiency of the test by carrying out a test under an application environment or an ATE test according to the test selection command.

Abstract: A sequential semiconductor device tester, and in particular to a sequential semiconductor device tester is disclosed. In accordance with the sequential semiconductor device tester, a function of generating a test pattern data for a test of a semiconductor device and a function of carrying out the test are separated to sequentially test the semiconductor device, to maintain a signal integrity and to improve an efficiency of the test by carrying out a test under an application environment or an ATE test according to the test pattern data.

Abstract: A sequential semiconductor device tester, and in particular to a sequential semiconductor device tester is disclosed. In accordance with the sequential semiconductor device tester, a function of generating a test pattern data for a test of a semiconductor device and a function of carrying out the test are separated to sequentially test the semiconductor device, to maintain a signal integrity and to improve an efficiency of the test by carrying out a test under an application environment or an ATE test according to the test selection command.

Abstract: A sequential semiconductor device tester, and in particular to a sequential semiconductor device tester is disclosed. In accordance with the sequential semiconductor device tester, a function of generating a test pattern data for a test of a semiconductor device and a function of carrying out the test are separated to sequentially test the semiconductor device, to maintain a signal integrity and to improve an efficiency of the test by carrying out a test under an application environment or an ATE test according to the test pattern data.

Abstract: A cargo container having a floor, a front wall, and spaced side walls. The floor, front wall, and spaced side walls cooperatively bound a cargo storage space. The front and spaced side walls each have an exposed inside surface bounding the cargo storage space and an exposed outside surface. The front and spaced side walls cooperatively define a peripheral wall structure having a top and bottom. At least part of the peripheral wall structural has at least one corrugated sheet having alternating ridges and grooves. The ridges and grooves have lengths extending in a direction between the top and bottom of the peripheral wall structure. At least part of the peripheral wall structure has at least one external panel that is connected to the at least one corrugated sheet so as to define a substantial area of the exposed outside surface.

Abstract: A cargo container having a floor, a front wall, and spaced side walls. The floor, front wall, and spaced side walls cooperatively bound a cargo storage space. The front and spaced side walls each have an exposed inside surface bounding the cargo storage space and an exposed outside surface. The front and spaced side walls cooperatively define a peripheral wall structure having a top and bottom. At least part of the peripheral wall structural has at least one corrugated sheet having alternating ridges and grooves. The ridges and grooves have lengths extending in a direction between the top and bottom of the peripheral wall structure. At least part of the peripheral wall structure has at least one external panel that is connected to the at least one corrugated sheet so as to define a substantial area of the exposed outside surface.

Abstract: A lift fitting for cargo containers. The lift fitting can be constructed as an intermediate lift fitting to be positioned inboard from the corners of the container. The lift fitting defines a hollow body member with apertures for receiving lifting such as a crane arm or coupling devices such as twist locks. The lift fitting also has an extension on an outside surface for attachment to the cargo container to maintain the integrity and geometry of the container and to minimize the number of welds and the associated construction costs. In a particular example, the lift fitting has both a horizontal extension and a vertical extension for attachment to a cargo container.