Patents by Inventor Sangthip Foongtrakoolratana

Sangthip Foongtrakoolratana has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20020147946
    Abstract: Aspects for generating test reports from memory device reliability testing are described. The aspects include utilizing a memory device reliability testing system for write endurance testing of a plurality of lots of memory devices. Program instructions are performed to automatically generate a test report from results data of each of a chosen number of the plurality of lots substantially simultaneously.
    Type: Application
    Filed: April 5, 2001
    Publication date: October 10, 2002
    Inventors: Yong Jaimsomporn, Somnuek Thongprasert, Sangthip Foongtrakoolratana