Patents by Inventor Sanjay Devdas

Sanjay Devdas has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method for mapping a natural gas leak
    Patent number: 7486399
    Abstract: A system is described that is suitable for use in determining the location of leaks of gases having a background concentration. The system is a point-wise backscatter absorption gas measurement system that measures absorption and distance to each point of an image. The absorption measurement provides an indication of the total amount of a gas of interest, and the distance provides an estimate of the background concentration of gas. The distance is measured from the time-of-flight of laser pulse that is generated along with the absorption measurement light. The measurements are formatted into an image of the presence of gas in excess of the background. Alternatively, an image of the scene is superimposed on the image of the gas to aid in locating leaks. By further modeling excess gas as a plume having a known concentration profile, the present system provides an estimate of the maximum concentration of the gas of interest.
    Type: Grant
    Filed: February 4, 2008
    Date of Patent: February 3, 2009
    Assignee: Sandia Corporation
    Inventors: Thomas A. Reichardt, Amy Khai Luong, Thomas J. Kulp, Sanjay Devdas
  • Natural gas leak mapper
    Patent number: 7375814
    Abstract: A system is described that is suitable for use in determining the location of leaks of gases having a background concentration. The system is a point-wise backscatter absorption gas measurement system that measures absorption and distance to each point of an image. The absorption measurement provides an indication of the total amount of a gas of interest, and the distance provides an estimate of the background concentration of gas. The distance is measured from the time-of-flight of laser pulse that is generated along with the absorption measurement light. The measurements are formated into an image of the presence of gas in excess of the background. Alternatively, an image of the scene is superimosed on the image of the gas to aid in locating leaks. By further modeling excess gas as a plume having a known concentration profile, the present system provides an estimate of the maximum concentration of the gas of interest.
    Type: Grant
    Filed: March 11, 2005
    Date of Patent: May 20, 2008
    Assignee: Sandia Corporation
    Inventors: Thomas A. Reichardt, Amy Khai Luong, Thomas J. Kulp, Sanjay Devdas
  • Natural gas leak mapper
    Publication number: 20060203248
    Abstract: A system is described that is suitable for use in determining the location of leaks of gases having a background concentration. The system is a point-wise backscatter absorption gas measurement system that measures absorption and distance to each point of an image. The absorption measurement provides an indication of the total amount of a gas of interest, and the distance provides an estimate of the background concentration of gas. The distance is measured from the time-of-flight of laser pulse that is generated along with the absorption measurement light. The measurements are formated into an image of the presence of gas in excess of the background. Alternatively, an image of the scene is superimosed on the image of the gas to aid in locating leaks. By further modeling excess gas as a plume having a known concentration profile, the present system provides an estimate of the maximum concentration of the gas of interest.
    Type: Application
    Filed: March 11, 2005
    Publication date: September 14, 2006
    Inventors: Thomas Reichardt, Amy Luong, Thomas Kulp, Sanjay Devdas