Patents by Inventor Sanjay Govindjee

Sanjay Govindjee has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10429256
    Abstract: Nanoscale stress-sensing can be used across fields ranging from detection of incipient cracks in structural mechanics to monitoring forces in biological tissues. We demonstrate how tetrapod quantum dots (tQDs) embedded in block-copolymers act as sensors of tensile/compressive stress. Remarkably, tQDs can detect their own composite dispersion and mechanical properties, with a switch in optomechanical response when tQDs are in direct contact. Using experimental characterizations, atomistic simulations and finite-element analyses, we show that under tensile stress, densely-packed tQDs exhibit a photoluminescence peak shifted to higher energies (“blue-shift”) due to volumetric compressive stress in their core; loosely-packed tQDs exhibit a peak shifted to lower energies (“red-shift”) from tensile stress in the core. The stress-shifts result from the tQD's unique branched morphology in which the CdS arms act as antennas that amplify the stress in the CdSe core.
    Type: Grant
    Filed: May 26, 2017
    Date of Patent: October 1, 2019
    Assignee: The Regents of the University of California
    Inventors: Shilpa N. Raja, Danylo Zherebetskyy, Siva Wu, Peter Ercius, Andrew C. K. Olson, Paul Alvisatos, Robert O. Ritchie, Sanjay Govindjee
  • Patent number: 8079246
    Abstract: The present invention provides a device for in-situ monitoring of material, process and dynamic properties of a MEMS device. The monitoring device includes a pair of comb drives, a cantilever suspension comprising a translating shuttle operatively connected with the pair of comb drives, structures for applying an electrical potential to the comb drives to displace the shuttle, structures for measuring an electrical potential from the pair of comb drives; measuring combs configured to measure the displacement of the shuttle, and structures for measuring an electrical capacitance of the measuring combs. Each of the comb drives may have differently sized comb finger gaps and a different number of comb finger gaps. The shuttle may be formed on two cantilevers perpendicularly disposed with the shuttle, whereby the cantilevers act as springs to return the shuttle to its initial position after each displacement.
    Type: Grant
    Filed: April 19, 2007
    Date of Patent: December 20, 2011
    Assignee: The Regents of the University of California
    Inventors: David Garmire, Hyuck Choo, Richard S. Muller, James Demmel, Sanjay Govindjee
  • Publication number: 20090322365
    Abstract: The present invention provides a device for in-situ monitoring of material, process and dynamic properties of a MEMS device. The monitoring device includes a pair of comb drives, a cantilever suspension comprising a translating shuttle operatively connected with the pair of comb drives, structures for applying an electrical potential to the comb drives to displace the shuttle, structures for measuring an electrical potential from the pair of comb drives; measuring combs configured to measure the displacement of the shuttle, and structures for measuring an electrical capacitance of the measuring combs. Each of the comb drives may have differently sized comb finger gaps and a different number of comb finger gaps. The shuttle may be formed on two cantilevers perpendicularly disposed with the shuttle, whereby the cantilevers act as springs to return the shuttle to its initial position after each displacement.
    Type: Application
    Filed: April 19, 2007
    Publication date: December 31, 2009
    Applicant: Regents of the University of California
    Inventors: David Garmire, Hyuck Choo, Richard S. Muller, James Demmel, Sanjay Govindjee