Patents by Inventor Sanjay Kamtekar

Sanjay Kamtekar has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10175184
    Abstract: The invention includes an XRF analyzer with reduced x-ray attenuation between sample and target and between sample and detector. Attenuation can be reduced by removing atmospheric-air paths through which the x-rays must travel. Reduced x-ray attenuation can allow for easier detection of low-atomic-number elements. Cost saving can be achieved by reducing the number of x-ray windows.
    Type: Grant
    Filed: June 2, 2016
    Date of Patent: January 8, 2019
    Assignee: Moxtek, Inc.
    Inventors: Richard Creighton, Steven Morris, Shawn Chin, Sanjay Kamtekar
  • Patent number: 9839106
    Abstract: The invention includes a flat-panel-display (FPD) manufacturing machine which utilizes x-rays for electrostatic dissipation of a bottom side of a FPD when lifting the FPD off of a table during manufacture of the FPD. The invention also includes a method of electrostatic dissipation of a bottom side of an FPD.
    Type: Grant
    Filed: October 28, 2015
    Date of Patent: December 5, 2017
    Assignee: Moxtek, Inc.
    Inventors: Eric Miller, Steven West Wilson, Sanjay Kamtekar, Bill Hansen, Brad Harris
  • Patent number: 9826610
    Abstract: An electrostatic-dissipation device comprising an x-ray tube and an electrically-conductive shell that is electrically coupled to an anode of the x-ray tube can be used for electrostatic dissipation, especially at a bottom side of a flat-panel-display (FPD).
    Type: Grant
    Filed: October 22, 2015
    Date of Patent: November 21, 2017
    Assignee: Moxtek, Inc.
    Inventors: Eric Miller, Steven West Wilson, Sanjay Kamtekar, Bill Hansen, Brad Harris
  • Publication number: 20160370307
    Abstract: The invention includes an XRF analyzer with reduced x-ray attenuation between sample and target and between sample and detector. Attenuation can be reduced by removing atmospheric-air paths through which the x-rays must travel. Reduced x-ray attenuation can allow for easier detection of low-atomic-number elements. Cost saving can be achieved by reducing the number of x-ray windows.
    Type: Application
    Filed: June 2, 2016
    Publication date: December 22, 2016
    Inventors: Richard Creighton, Steven Morris, Shawn Chin, Sanjay Kamtekar
  • Publication number: 20160066400
    Abstract: The invention includes a flat-panel-display (FPD) manufacturing machine which utilizes x-rays for electrostatic dissipation of a bottom side of a FPD when lifting the FPD off of a table during manufacture of the FPD. The invention also includes a method of electrostatic dissipation of a bottom side of an FPD.
    Type: Application
    Filed: October 28, 2015
    Publication date: March 3, 2016
    Inventors: Eric Miller, Steven West Wilson, Sanjay Kamtekar, Bill Hansen, Brad Harris
  • Publication number: 20160044768
    Abstract: An electrostatic-dissipation device comprising an x-ray tube and an electrically-conductive shell that is electrically coupled to an anode of the x-ray tube can be used for electrostatic dissipation, especially at a bottom side of a flat-panel-display (FPD).
    Type: Application
    Filed: October 22, 2015
    Publication date: February 11, 2016
    Inventors: Eric Miller, Steven West Wilson, Sanjay Kamtekar, Bill Hansen, Brad Harris
  • Publication number: 20150016590
    Abstract: An elongated x-ray tube that can emit a linear curtain of x-rays along its length. Methods of using an elongated curtain of x-rays.
    Type: Application
    Filed: April 30, 2014
    Publication date: January 15, 2015
    Applicant: Moxtek, Inc.
    Inventors: Todd S. Parker, Sanjay Kamtekar, William Hansen
  • Patent number: 5846753
    Abstract: A method of detecting the presence of a substance being monitored in a medium, selected from the group of substances including organophosphorus compounds and the metal ions Zn, Be and Bi, including the steps of: providing a 1,2-dioxetane phenyl phosphate compound; providing a phosphatase that catalytically degrades the 1,2-dioxetane phenyl phosphate compound to produce light, the catalytic activity of the phosphatase toward 1,2-dioxetane phenyl phosphate compound being altered by the substance being monitored; exposing the 1,2-dioxetane phenyl phosphate compound and the phosphatase together to a medium which may contain the substance being monitored; detecting light produced after the exposing step; and determining, from the detected light, the presence and concentration in the medium of the substance being monitored.
    Type: Grant
    Filed: May 30, 1995
    Date of Patent: December 8, 1998
    Assignee: The United States of America as represented by the Secretary of the Army
    Inventors: Joseph A. Akkara, David L. Kaplan, Madhu S. R. Ayyagari, Kenneth A. Marx, Sanjay Kamtekar, Rajiv Pande, Sukant K. Tripathy, Jayant Kumar