Abstract: Disclosed herein is a cost effective, efficient, massively parallel multi-wafer test cell. Additionally, this test cell can be used for both single-touchdown and multiple-touchdown applications. The invention uses a novel “split-cartridge” design, combined with a method for aligning wafers when they are separated from the probe card assembly, to create a cost effective, efficient multi-wafer test cell. A “probe-card stops” design may be used within the cartridge to simplify the overall cartridge design and operation.

Abstract: Disclosed herein is a cost effective, efficient, massively parallel multi-wafer test cell. Additionally, this test cell can be used for both single-touchdown and multiple-touchdown applications. The invention uses a novel “split-cartridge” design, combined with a method for aligning wafers when they are separated from the probe card assembly, to create a cost effective, efficient multi-wafer test cell. A “probe-card stops” design may be used within the cartridge to simplify the overall cartridge design and operation.

Abstract: In one embodiment, an interface includes a plurality of test electronics to DUT interfaces. Each test electronics to DUT interface has at least one test electronics interface, at least one DUT interface, and an electrical coupling between the at least one test electronics interface and the at least one DUT interface. First and second subsets of the DUT interfaces are respectively positioned along the perimeters of first and second concentric shapes.

Abstract: In one embodiment, a test system has a set of test electronics for testing a device under test (DUT). The test system also has at least one test electronics to DUT interface having a zero insertion force (ZIF) connector. Each ZIF connector has a ZIF connector to DUT clamping mechanism configured to i) apply a first orthogonal force to a probe card that interfaces with a DUT, by pressing the ZIF connector against the probe card, and simultaneously ii) exert at least one second orthogonal force on the probe card, the at least one second orthogonal force being opposite in direction to the first orthogonal force.

Abstract: In one embodiment, a test system has a set of test electronics for testing a device under test (DUT). The test system also has at least one test electronics to DUT interface having a zero insertion force (ZIF) connector. Each ZIF connector has a ZIF connector to DUT clamping mechanism configured to i) apply a first orthogonal force to a probe card that interfaces with a DUT, by pressing the ZIF connector against the probe card, and simultaneously ii) exert at least one second orthogonal force on the probe card, the at least one second orthogonal force being opposite in direction to the first orthogonal force.

Abstract: There is disclosed apparatus for routing signals between at least one PCB within a test head and a socket card assembly. In an embodiment, the apparatus may include at least one flexible circuit electrically connecting first and second sides of the PCB and the socket card assembly with one another, and the flexible circuit having a defined shape configured to interface with the socket card assembly and the PCB along substantially perpendicular planes. Methods of routing signals between at least one PCB within a test head and a socket card assembly are disclosed. In one embodiment, a method may include electrically connecting first and second sides of the PCB and the socket card assembly with one another with at least one flexible circuit having a defined shape configured to interface with the socket card assembly and the PCB along substantially perpendicular planes. Other embodiments are also disclosed.

Abstract: A screw-less latching system for securing load boards comprises a frame and a backer plate. The frame includes a loading site for a device under test. The loading site includes a first tee clamp disposed along a first longitudinal axis and a second tee clamp disposed along a second longitudinal axis of the loading site. The loading site further includes a first spring plunger disposed along a first lateral axis of the loading site. The backer plate is configured to attach the device under test. The backer plate includes two lock tabs coupling with the first and second tee clamps. The backer plate further includes a first recess coupling with the first spring plunger.

Abstract: A screw-less latching system for securing load boards comprises a frame and a backer plate. The frame includes a loading site for a device under test. The loading site includes a first tee clamp disposed along a first longitudinal axis and a second tee clamp disposed along a second longitudinal axis of the loading site. The loading site further includes a first spring plunger disposed along a first lateral axis of the loading site. The backer plate is configured to attach the device under test. The backer plate includes two lock tabs coupling with the first and second tee clamps. The backer plate further includes a first recess coupling with the first spring plunger.

Abstract: There is disclosed apparatus for routing signals between at least one PCB within a test head and a socket card assembly. In an embodiment, the apparatus may include at least one flexible circuit electrically connecting first and second sides of the PCB and the socket card assembly with one another, and the flexible circuit having a defined shape configured to interface with the socket card assembly and the PCB along substantially perpendicular planes. Methods of routing signals between at least one PCB within a test head and a socket card assembly are disclosed. In one embodiment, a method may include electrically connecting first and second sides of the PCB and the socket card assembly with one another with at least one flexible circuit having a defined shape configured to interface with the socket card assembly and the PCB along substantially perpendicular planes. Other embodiments are also disclosed.

Abstract: A method of controlling, in a warm-blooded animal, an infectious microorganism expressing a chorionic gonadotropin-like growth-regulating protein comprises modulating the activity of the protein by administering to the warm-blooded animal an effective amount of an antibody capable of inhibiting the activity of the protein, the chorionic gonadotropin-like growth-regulating protein itself such that the animal develops a neutralizing immune response, or peptides that block the receptors of the chorionic gonadotropin-like growth-regulating protein in the infectious microorganism. Candida albicans is one such microorganism that can be controlled by delivering an antibody against the growth-regulating protein, CaCGLP. Mycobacteria can also be controlled by this method. A method of inhibiting transition of Candida albicans blastospores in vitro by contacting the blastospores with an antibody against CaCGLP is also disclosed.

Abstract: A protein isolated from Pseudomonas maltophilia is found to possess an exposed, immunologically accessible protein which binds to the FC region of several species of immunoglobulins. The protein is found to bind both IgG and IgA immunoglobulins and is found to have an effective molecular weight of approximately 30,000 daltons. The protein is found to be useful in isolation of IgA immunoglobulins from biological mixtures. The protein makes IgA immunoglobulins available for further analytical techniques, including identifying bacteria which contain IgA binding proteins. Because of the increased availability of IgA immunoglobulins, it is possible to diagnosis and treat IgA-related diseases and their sources.