Abstract: A laser source (10) for emitting an output beam (12) along an output axis (12A) includes (i) a first laser module (16) that generates a first beam (16A); (ii) a second laser module (18) that generates a second beam (18A); (iii) a beam selector assembly (32); (iv) a first director assembly (24) that directs the first beam (16A) at the beam selector assembly (32); (v) a second director assembly (26) that directs the second beam (18A) at the beam selector assembly (32); and (vii) a control system (34) that directs power to the modules (16), (18). The beam selector assembly (32) moves between a first position in which the first beam (16A) is directed along the output axis (12A), and a second position in which the second beam (18A) is directed along the output axis (12A).

Abstract: A laser source (10) for emitting an output beam (12) along an output axis (12A) includes (i) a first laser module (16) that generates a first beam (16A); (ii) a second laser module (18) that generates a second beam (18A); (iii) a beam selector assembly (32); (iv) a first director assembly (24) that directs the first beam (16A) at the beam selector assembly (32); (v) a second director assembly (26) that directs the second beam (18A) at the beam selector assembly (32); and (vii) a control system (34) that directs power to the modules (16), (18). The beam selector assembly (32) moves between a first position in which the first beam (16A) is directed along the output axis (12A), and a second position in which the second beam (18A) is directed along the output axis (12A).

Abstract: A device for automatically presenting electronic devices to a tester for testing. A plurality of carriers, each for carrying a set of electronic devices are cyclically conveyed in a close loop from a loading stage where electronic devices are loaded onto the carriers, through a pre-test chamber, such as a "soak" chamber, from the pre-test chamber to a test stage where the devices are preferably lifted from the carrier to come into contact with a test head contactor for testing, from the test stage to a post-test chamber, such as "un-soak" chamber, through the post-test chamber to an unloading stage where the carriers are unloaded of the tested electronic devices, and then from the unloading stage back to the loading stage to receive a new set of untested electronic devices. Optionally, each carrier comprises a set of secondary carriers which ride in a like number of seats defined by a primary carrier and sets of electronic devices are loaded onto and unloaded from the secondary carriers.