Abstract: An x-ray analyser for a transmission electron microscope is described. The analyser has a silicon drift detector moveable in use between an analysis position and a retracted position. The analyser has a housing having an end portion within which the silicon drift detector is retained. The end portion is formed from a material with a relative magnetic permeability of less than 1.004. The analyser also has an automatic retraction system adapted to move the silicon drift detector from the analysis position to the retracted position upon receipt of a trigger signal indicative of a condition in which the power level received by the silicon drift detector from impinging x-rays or electrons is above a predetermined threshold.

Abstract: A sample inspection apparatus comprises a sample support; a detection system for detecting radiation emitted by or transmitted through a sample on the sample support in response to radiation incident on the sample; and a cooling system for cooling at least one of the sample support and detection system. The cooling system includes at least one oscillating, mechanical component which oscillates at a frequency different from the at least one of the support and detection system.

Abstract: A detection system for detecting X-ray radiation from a sample located in a microbeam instrument. The detection system comprises: a. a pulse tube cooler; b. a compressor connected to the pulse tube cooler; c. a sensor coupled to the pulse tube cooler; and, d. a housing containing the pulse tube cooler and the sensor. The pulse tube cooler, the sensor and at least part of the housing are sufficiently small to be positioned inside the microbeam instrument in use, thereby allowing the X-ray radiation from the sample to be detected by the sensor.

Abstract: A detection system for detecting X-ray radiation from a sample located in a microbeam instrument.