Patents by Inventor Santosh B. Narasimhachary

Santosh B. Narasimhachary has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • System, apparatus, and method for estimating life of components
    Patent number: 11137751
    Abstract: A method for estimating life of a component includes obtaining fracture data corresponding to a component. The fracture data includes a first dataset corresponding to a threshold region where the crack in the component is dormant below a fatigue threshold. The method further includes determining initial estimates of parameters of a crack growth rate model and parameters of temperature models corresponding to the crack growth rate model based on the fracture data. The method also includes computing optimized parameters of temperature models corresponding to the crack growth rate model, and a scatter parameter via simulation of a joint optimization method using the initial estimates. The method includes determining a cumulative distribution function based on the optimized parameters and the scatter parameter and estimating life of the component based on the cumulative distribution function.
    Type: Grant
    Filed: November 5, 2019
    Date of Patent: October 5, 2021
    Assignee: Siemens Aktiengesellschaft
    Inventors: Sankar Narayanan, Santosh B. Narasimhachary, Kai Kadau, Sachin R. Shinde
  • SYSTEM, APPARATUS, AND METHOD FOR ESTIMATING LIFE OF COMPONENTS
    Publication number: 20210132599
    Abstract: A method for estimating life of a component includes obtaining fracture data corresponding to a component. The fracture data includes a first dataset corresponding to a threshold region where the crack in the component is dormant below a fatigue threshold. The method further includes determining initial estimates of parameters of a crack growth rate model and parameters of temperature models corresponding to the crack growth rate model based on the fracture data. The method also includes computing optimized parameters of temperature models corresponding to the crack growth rate model, and a scatter parameter via simulation of a joint optimization method using the initial estimates. The method includes determining a cumulative distribution function based on the optimized parameters and the scatter parameter and estimating life of the component based on the cumulative distribution function.
    Type: Application
    Filed: November 5, 2019
    Publication date: May 6, 2021
    Inventors: Sankar Narayanan, Santosh B. Narasimhachary, Kai Kadau, Sachin R. Shinde