Abstract: In order to make a processing beam close to a circular shape, in a processing apparatus including an optical device that guides a laser beam emitted from a light source to a target object and processing the target object with light emitted from the optical device, the optical device includes a correction mechanism that corrects rotationally asymmetric optical characteristics of the optical device, the correction mechanism includes at least two optical elements with rotationally asymmetric power, and a mechanism that enables the at least two optical elements to rotate about their respective optical axes, the amount of rotationally asymmetric optical characteristics changes due to a rotation angle difference between the at least two optical elements, and a direction of the rotationally asymmetric optical characteristics changes depending on a common rotation angle of the at least two optical elements.

Abstract: A method for calculating a shape includes dividing an aspherical test surface into a plurality of measurement regions configured to overlap with one another, receiving, at a light receiving unit, interference fringes which occur due to interference light generated by light reflected on a reference surface serving as a reference for calculating a shape of the test surface and light reflected by each of the measurement regions, and calculating surface shapes of the measurement regions, and calculating a shape of the test surface by joining the calculated surface shapes, wherein the calculation of surface shapes includes adjusting relative positions of the test surface and the reference surface and adjusting a position of the light receiving unit so that the test surface and the light receiving unit have a conjugate relationship with each other in a state in which the position of the test surface is adjusted.

Abstract: A method for calculating a shape includes dividing an aspherical test surface into a plurality of measurement regions configured to overlap with one another, receiving, at a light receiving unit, interference fringes which occur due to interference light generated by light reflected on a reference surface serving as a reference for calculating a shape of the test surface and light reflected by each of the measurement regions, and calculating surface shapes of the measurement regions, and calculating a shape of the test surface by joining the calculated surface shapes, wherein the calculation of surface shapes includes adjusting relative positions of the test surface and the reference surface and adjusting a position of the light receiving unit so that the test surface and the light receiving unit have a conjugate relationship with each other in a state in which the position of the test surface is adjusted.

Abstract: A measurement apparatus for measuring a surface map comprises an image sensor, an optical system including a reference surface and arranged to form an interferogram of a reflected wavefront from a test surface and that from the reference surface on an image sensing surface of the image sensor and a calculation unit which calculates a surface map of the measurement target based on the interferogram. The calculation unit calculates the surface map of the measurement target by utilizing first data which expresses, by a first coordinate system, data in a state in which a central axis of the test surface is at a first angle to an optical axis of the optical system, and second data which expresses, by a second coordinate system obtained by shifting the first coordinate system, data in a state in which the central axis is at a second angle to the optical axis.

Abstract: A measurement apparatus for measuring a surface map comprises an image sensor, an optical system including a reference surface and arranged to form an interferogram of a reflected wavefront from a test surface and that from the reference surface on an image sensing surface of the image sensor and a calculation unit which calculates a surface map of the measurement target based on the interferogram. The calculation unit calculates the surface map of the measurement target by utilizing first data which expresses, by a first coordinate system, data in a state in which a central axis of the test surface is at a first angle to an optical axis of the optical system, and second data which expresses, by a second coordinate system obtained by shifting the first coordinate system, data in a state in which the central axis is at a second angle to the optical axis.