Patents by Inventor Sarah B. HIGGINS

Sarah B. HIGGINS has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Testing integrated circuit designs containing multiple phase rotators
    Patent number: 11016144
    Abstract: Approaches for testing phase rotators are provided. A circuit for testing phase rotators includes a compare element including a first input and a second input, wherein the compare element is configured to compare a first phase of a first signal provided at the first input to a second phase of a second signal provided at the second input. The circuit also includes a first test bus connected to the first input and a second test bus connected to the second input.
    Type: Grant
    Filed: January 10, 2020
    Date of Patent: May 25, 2021
    Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATION
    Inventors: Robert G. Gerowitz, Sarah B. Higgins, Joseph A. Iadanza
  • Testing integrated circuit designs containing multiple phase rotators
    Patent number: 10761136
    Abstract: Approaches for testing phase rotators are provided. A circuit for testing phase rotators includes a compare element including a first input and a second input, wherein the compare element is configured to compare a first phase of a first signal provided at the first input to a second phase of a second signal provided at the second input. The circuit also includes a first test bus connected to the first input and a second test bus connected to the second input.
    Type: Grant
    Filed: November 17, 2017
    Date of Patent: September 1, 2020
    Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATION
    Inventors: Robert G. Gerowitz, Sarah B. Higgins, Joseph A. Iadanza
  • TESTING INTEGRATED CIRCUIT DESIGNS CONTAINING MULTIPLE PHASE ROTATORS
    Publication number: 20200150175
    Abstract: Approaches for testing phase rotators are provided. A circuit for testing phase rotators includes a compare element including a first input and a second input, wherein the compare element is configured to compare a first phase of a first signal provided at the first input to a second phase of a second signal provided at the second input. The circuit also includes a first test bus connected to the first input and a second test bus connected to the second input.
    Type: Application
    Filed: January 10, 2020
    Publication date: May 14, 2020
    Inventors: Robert G. GEROWITZ, Sarah B. HIGGINS, Joseph A. IADANZA
  • Testing integrated circuit designs containing multiple phase rotators
    Patent number: 10585140
    Abstract: Approaches for testing phase rotators are provided. A circuit for testing phase rotators includes a compare element including a first input and a second input, wherein the compare element is configured to compare a first phase of a first signal provided at the first input to a second phase of a second signal provided at the second input. The circuit also includes a first test bus connected to the first input and a second test bus connected to the second input.
    Type: Grant
    Filed: November 17, 2017
    Date of Patent: March 10, 2020
    Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATION
    Inventors: Robert G. Gerowitz, Sarah B. Higgins, Joseph A. Iadanza
  • Testing integrated circuit designs containing multiple phase rotators
    Patent number: 9927489
    Abstract: Approaches for testing phase rotators are provided. A circuit for testing phase rotators includes a compare element including a first input and a second input, wherein the compare element is configured to compare a first phase of a first signal provided at the first input to a second phase of a second signal provided at the second input. The circuit also includes a first test bus connected to the first input and a second test bus connected to the second input.
    Type: Grant
    Filed: January 15, 2014
    Date of Patent: March 27, 2018
    Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATION
    Inventors: Robert G. Gerowitz, Sarah B. Higgins, Joseph A. Iadanza
  • TESTING INTEGRATED CIRCUIT DESIGNS CONTAINING MULTIPLE PHASE ROTATORS
    Publication number: 20180074120
    Abstract: Approaches for testing phase rotators are provided. A circuit for testing phase rotators includes a compare element including a first input and a second input, wherein the compare element is configured to compare a first phase of a first signal provided at the first input to a second phase of a second signal provided at the second input. The circuit also includes a first test bus connected to the first input and a second test bus connected to the second input.
    Type: Application
    Filed: November 17, 2017
    Publication date: March 15, 2018
    Inventors: Robert G. GEROWITZ, Sarah B. HIGGINS, Joseph A. IADANZA
  • TESTING INTEGRATED CIRCUIT DESIGNS CONTAINING MULTIPLE PHASE ROTATORS
    Publication number: 20180074121
    Abstract: Approaches for testing phase rotators are provided. A circuit for testing phase rotators includes a compare element including a first input and a second input, wherein the compare element is configured to compare a first phase of a first signal provided at the first input to a second phase of a second signal provided at the second input. The circuit also includes a first test bus connected to the first input and a second test bus connected to the second input.
    Type: Application
    Filed: November 17, 2017
    Publication date: March 15, 2018
    Inventors: Robert G. GEROWITZ, Sarah B. HIGGINS, Joseph A. IADANZA
  • TESTING INTEGRATED CIRCUIT DESIGNS CONTAINING MULTIPLE PHASE ROTATORS
    Publication number: 20150198661
    Abstract: Approaches for testing phase rotators are provided. A circuit for testing phase rotators includes a compare element including a first input and a second input, wherein the compare element is configured to compare a first phase of a first signal provided at the first input to a second phase of a second signal provided at the second input. The circuit also includes a first test bus connected to the first input and a second test bus connected to the second input.
    Type: Application
    Filed: January 15, 2014
    Publication date: July 16, 2015
    Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION
    Inventors: Robert G. GEROWITZ, Sarah B. HIGGINS, Joseph A. IADANZA