Patents by Inventor Sarah Prue

Sarah Prue has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • CONTENT BASED YIELD PREDICTION OF VLSI DESIGNS
    Publication number: 20060253806
    Abstract: A system, method and program product for predicting yield of a VLSI design. A method is providing including the steps of: identifying and grouping sub-circuits contained within an integrated circuit design by type; calculating critical area values for regions within the integrated circuit design; and applying different yield models to critical area values based on the types of the regions used to calculate the critical area values, wherein each yield model is dependent on a type.
    Type: Application
    Filed: May 9, 2005
    Publication date: November 9, 2006
    Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION
    Inventors: Robert Allen, Daria Dooling, Jason Hibbeler, Daniel Maynard, Sarah Prue, Ralph Williams
  • INTEGRATED CIRCUIT LAYOUT CRITICAL AREA DETERMINATION USING VORONOI DIAGRAMS AND SHAPE BIASING
    Publication number: 20060190224
    Abstract: Method, system and program product for determining a critical area in a region of an integrated circuit layout using Voronoi diagrams and shape biasing. The method includes the steps of generating a biased Voronoi diagram based on a layout geometry of the region and incorporating a shape bias; and determining the critical area for the region using the biased Voronoi diagram.
    Type: Application
    Filed: February 24, 2005
    Publication date: August 24, 2006
    Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION
    Inventors: Robert Allen, Peter Chan, Evanthia Papadopoulou, Sarah Prue, Mervyn Tan