Patents by Inventor Sarah Sabra Pettengill

Sarah Sabra Pettengill has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and apparatus for characterizing components of a device under test using on-chip trace logic analyzer
    Patent number: 7650555
    Abstract: A test system is disclosed wherein a device under test (DUT) includes a trace logic analyzer (TLA) that receives and stores test data. The test system includes both a master tester and a slave tester. The slave tester operates at a high speed data rate substantially faster than that of the master tester. The master tester instructs the TLA to monitor data that the DUT receives from the slave tester to detect a predetermined data pattern within the data. The slave tester transmits data including the predetermined data pattern to the DUT. The DUT receives the data. When the TLA in the DUT detects the predetermined data pattern in the received data, the TLA stores that data pattern as a stored data pattern. The master tester retrieves the stored data pattern and compares the stored data pattern with the original predetermined data pattern. If the master tester determines that the stored data pattern is the same as the original predetermined data pattern, then the master tester generates a pass result.
    Type: Grant
    Filed: July 27, 2006
    Date of Patent: January 19, 2010
    Assignee: International Business Machines Corporation
    Inventors: Kerry Christopher Imming, Resham Rajendra Kulkarni, To Dieu Liang, Sarah Sabra Pettengill
  • METHOD AND APPARATUS FOR CHARACTERIZING COMPONENTS OF A DEVICE UNDER TEST USING ON-CHIP TRACE LOGIC ANALYZER
    Publication number: 20080028269
    Abstract: A test system is disclosed wherein a device under test (DUT) includes a trace logic analyzer (TLA) that receives and stores test data. The test system includes both a master tester and a slave tester. The slave tester operates at a high speed data rate substantially faster than that of the master tester. The master tester instructs the TLA to monitor data that the DUT receives from the slave tester to detect a predetermined data pattern within the data. The slave tester transmits data including the predetermined data pattern to the DUT. The DUT receives the data. When the TLA in the DUT detects the predetermined data pattern in the received data, the TLA stores that data pattern as a stored data pattern. The master tester retrieves the stored data pattern and compares the stored data pattern with the original predetermined data pattern. If the master tester determines that the stored data pattern is the same as the original predetermined data pattern, then the master tester generates a pass result.
    Type: Application
    Filed: July 27, 2006
    Publication date: January 31, 2008
    Applicant: IBM Corporation
    Inventors: KERRY CHRISTOPHER IMMING, RESHAM RAJENDRA KULKARNI, TO DIEU LIANG, SARAH SABRA PETTENGILL