Patents by Inventor Sarath K. Tennakoon

Sarath K. Tennakoon has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Glass container stress measurement using fluorescence
    Patent number: 8134695
    Abstract: An apparatus and method for measurement of the stress in and thickness of the walls of glass containers is disclosed that uses fluorescence to quickly and accurately ascertain both the thickness of the stress layers and the wall thickness in addition to the stress curve in glass containers. The apparatus and method may be used to quickly and accurately measure both the stress in and the thickness of the side walls of glass containers throughout the circumference of the glass containers. The apparatus and method are adapted for large scale glass container manufacturing, and are capable of high speed measurement of the stress in and the thickness of the side walls of glass containers.
    Type: Grant
    Filed: August 5, 2009
    Date of Patent: March 13, 2012
    Assignee: Emhart Glass S.A.
    Inventors: William J. Furnas, Sarath K. Tennakoon, Gary C. Weber
  • Glass thickness measurement using fluorescence
    Patent number: 8094293
    Abstract: An apparatus and method for measurement of the stress in and thickness of flat glass or curved glass segments is disclosed that uses fluorescence to quickly and accurately ascertain both the thickness of the stress layers and the wall thickness in addition to the stress curve in flat glass or curved glass segments. The apparatus and method may be used to quickly and accurately measure both the stress in and the thickness of flat glass or curved glass segments at a plurality of various locations therein. The apparatus and method are adapted for large scale flat glass or curved glass segment manufacturing, and are capable of high speed measurement of the stress in and the thickness of the flat glass or curved glass segments.
    Type: Grant
    Filed: August 5, 2009
    Date of Patent: January 10, 2012
    Assignee: Emhart Glass S.A.
    Inventors: William J. Furnas, Sarath K. Tennakoon, Gary C. Weber
  • Glass stress measurement using fluorescence
    Patent number: 8049871
    Abstract: An apparatus and method for measurement of the stress in and thickness of flat glass or curved glass segments is disclosed that uses fluorescence to quickly and accurately ascertain both the thickness of the stress layers and the wall thickness in addition to the stress curve in flat glass or curved glass segments. The apparatus and method may be used to quickly and accurately measure both the stress in and the thickness of flat glass or curved glass segments at a plurality of various locations therein. The apparatus and method are adapted for large scale flat glass or curved glass segment manufacturing, and are capable of high speed measurement of the stress in and the thickness of the flat glass or curved glass segments.
    Type: Grant
    Filed: August 5, 2009
    Date of Patent: November 1, 2011
    Assignee: Emhart Glass S.A.
    Inventors: William J. Furnas, Sarath K. Tennakoon, Gary C. Weber
  • Glass Stress Measurement Using Fluorescence
    Publication number: 20110032510
    Abstract: An apparatus and method for measurement of the stress in and thickness of flat glass or curved glass segments is disclosed that uses fluorescence to quickly and accurately ascertain both the thickness of the stress layers and the wall thickness in addition to the stress curve in flat glass or curved glass segments. The apparatus and method may be used to quickly and accurately measure both the stress in and the thickness of flat glass or curved glass segments at a plurality of various locations therein. The apparatus and method are adapted for large scale flat glass or curved glass segment manufacturing, and are capable of high speed measurement of the stress in and the thickness of the flat glass or curved glass segments.
    Type: Application
    Filed: August 5, 2009
    Publication date: February 10, 2011
    Inventors: William J. Furnas, Sarath K. Tennakoon, Gary C. Weber
  • Glass Thickness Measurement Using Fluorescence
    Publication number: 20110032524
    Abstract: An apparatus and method for measurement of the stress in and thickness of flat glass or curved glass segments is disclosed that uses fluorescence to quickly and accurately ascertain both the thickness of the stress layers and the wall thickness in addition to the stress curve in flat glass or curved glass segments. The apparatus and method may be used to quickly and accurately measure both the stress in and the thickness of flat glass or curved glass segments at a plurality of various locations therein. The apparatus and method are adapted for large scale flat glass or curved glass segment manufacturing, and are capable of high speed measurement of the stress in and the thickness of the flat glass or curved glass segments.
    Type: Application
    Filed: August 5, 2009
    Publication date: February 10, 2011
    Inventors: William J. Furnas, Sarath K. Tennakoon, Gary C. Weber
  • Glass Container Stress Measurement Using Fluorescence
    Publication number: 20110033103
    Abstract: An apparatus and method for measurement of the stress in and thickness of the walls of glass containers is disclosed that uses fluorescence to quickly and accurately ascertain both the thickness of the stress layers and the wall thickness in addition to the stress curve in glass containers. The apparatus and method may be used to quickly and accurately measure both the stress in and the thickness of the side walls of glass containers throughout the circumference of the glass containers. The apparatus and method are adapted for large scale glass container manufacturing, and are capable of high speed measurement of the stress in and the thickness of the side walls of glass containers.
    Type: Application
    Filed: August 5, 2009
    Publication date: February 10, 2011
    Inventors: William J. Furnas, Sarath K. Tennakoon, Gary C. Weber