Abstract: A non-volatile, low, and zero power, high speed self-sensing programmable device and architecture including a non-volatile self-sensing cell. The non-volatile self-sensing cell is connected out of the speed path of the programmable device, permitting rapid, non-volatile programming and reading operations to be conducted. According to one version, two self-sensing cells are provided with a means for selecting one of the cells for programming or read operation. Each non-volatile self-sensing cell includes a latch having cross-coupled, pull-up transistors and non-volatile pull-down cells. The cross-coupled pull-up transistors are field effect transistors having gates which are connected to the opposite sources of the cross-coupled pull-up transistors.

Abstract: A method is provided for testing a non-programmable non-volatile memory which does not require the writing or erasing of any cells and permits the testing of all normal memory cells. Testing occurs from the device I/O pins and is useful in cases where EPROM memory cells have been bulk erased and placed within an ultraviolet-opaque package. The non-volatile memory is of the type having memory banks of rows and columns. Each bank must have address decoders and means for changing addresses between banks. A separate auxiliary cell or row of cells in a state different from the non-programmed state is provided. An address is supplied for the auxiliary cells and then for the normal cells and the interval between addressing the normal cells and the appearance of an output signal is measured and compared with a predetermined fixed limit. If the limit is exceeded, the address is identified as that of a weak cell whose speed does not meet product specifications.

Abstract: A read circuit for a semiconductor memory that includes a pass transistor between the output of a first sense amplifier reading the memory and a latch. The pass transistor blocks transmission of the sense amplifier's output to the latch whenever a noise glitch producing condition is sensed. A second sense amplifier connected through the same conductive line to the memory cell array as the first sense amplifier has a faster response and lower current threshold in order to detect the glitch producing condition. A pulse generator receives the output of the second sense amplifier and provides a control signal pulse of predetermined duration following detection of the glitch producing condition by the second sense amplifier. The pulse is received by a control gate of the pass transistor, turning the transistor off during the duration of the pulse.

Abstract: The present invention relates to an MOS integrated circuit employing a plurality of floating gate type, erasable, programmable read-only memory (EPROM) devices. The improvement of the invention comprises a clamp coupled to the control gates of the EPROMs, the clamp being adapted to clamp the voltage on these gates in the range of the typical supply voltage for the circuit, whereby, after an EPROM cell is properly charged, it will continue to read out as a properly charged cell even though some of the actual charge on its floating gate may have leaked.

Abstract: A circuit for compensating for MOS device response to supply voltage variations, as well as temperature and process variations, in an integrated circuit device. The compensation circuit produces a reference voltage which modulates the gate bias voltage of a MOS transistor such that the gate-to-source bias of the MOS transistor is varied to compensate for variations in the supply voltage as well as for variations in the temperature and manufacturing process. The circuit pulls up the reference voltage toward the supply voltage as the supply increases, thereby increasing the gate drive on the MOS transistor. The circuit provides compensation for both AC and DC supply variations. The MOS transistor is used to modulate the available current sinking capability in an IC device output buffer, such that as the MOS gate drive increases, the current sinking capability is reduced, thereby slowing the output state transitions as the supply increases, and reducing noise caused by supply variations.

Abstract: A metal-oxide-semiconductor (MOS) static decoding circuit for selecting an addressed line in a high density memory array, or the like, is disclosed. The circuit may be laid-out along array lines where the lines have a pitch of approximately 12.25 microns. Three levels of decoding are employed. The highest level permits the pulling-up of a common node in the second level decoder. The third level of decoding selects one of a plurality of array lines coupled to this node. Zero threshold voltage MOS devices are employed for coupling the first and third decoders to the second decoder.

Abstract: An MOS sensing amplifier for sensing the binary state of floating gate memory devices in a read-only memory is disclosed. The potentials on the column lines in the memory are held to a narrow voltage swing. A pair of "zero" threshold voltage transistors having slightly different threshold voltages are used to maintain the potentials on these lines. A potential developed from the column line is compared with a reference potential developed with a "dummy" biasing network and a "dummy" floating gate memory device.