Abstract: According to the present invention there is provided an assembly for testing optical devices, the assembly comprising, a light integrating sphere (5a); a mask member (160) defining an inlet window (51) for the light integrating sphere (5a); and a plurality of inlet adaptor members (170), each of which can be selectively arranged to cooperate with the mask member (160) so as to modify the amount of the inlet window (51) through which light can pass into the light integrating sphere (5a), and wherein each the plurality of inlet adaptor members (170) comprise openings (171) having different shapes and/or dimensions. There is further provided a corresponding method for testing parameters of a group of optical devices using the assembly.

Abstract: According to the present invention there is provided a method for testing electrical and optical parameters of a group of light-emitting devices, the method comprising the steps of, bringing the group of devices to a test position wherein light emitted by the devices in the group can be received into an integrating sphere; performing, electrical testing of the devices in the group in parallel, so that electrical parameters of each of the devices in the group can be determined; performing, in a sequential device-by-device manner, optical testing of the devices in the group, so that optical parameters of each of the devices in the group can be determined. There is further provided a corresponding assembly.