Patents by Inventor SAT BYUL KIM

SAT BYUL KIM has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • SUPER RESOLUTION SEM IMAGE IMPLEMENTING DEVICE AND METHOD THEREOF
    Publication number: 20230043089
    Abstract: Some example embodiments relate to a super resolution scanning electron microscope (SEM) image implementing device and/or a method thereof. Provided a super resolution scanning electron microscope (SEM) image implementing device comprising a processor configured to crop a low resolution SEM image to generate a first cropped image and a second cropped image, to upscale the first cropped image and the second cropped image to generate a first upscaled image and a second upscaled image, and to cancel noise from the first upscaled image and the second upscaled image to generate a first noise canceled image and a second noise canceled image.
    Type: Application
    Filed: April 15, 2022
    Publication date: February 9, 2023
    Applicant: Samsung Electronics Co., Ltd.
    Inventors: Ho Joon LEE, Il Kwon KIM, Sang Gul PARK, Chang Wook JEONG, Moon Hyun CHA, Sat Byul KIM
  • Grain analyzing method and system using HRTEM image
    Patent number: 10217205
    Abstract: Provided are a method and system for analyzing grains using a high-resolution transmission electron microscopy (HRTEM) image. The method relates to analyzing nanometer grains, and includes receiving an HRTEM image, setting local windows each having a predetermined size for the HRTEM image, performing at least one Fast Fourier transformation on pixel data determined by the local windows to calculate local transformation data; and analyzing grains based on the local transformation data.
    Type: Grant
    Filed: March 10, 2016
    Date of Patent: February 26, 2019
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: Min Chul Park, Dae Sin Kim, Sat Byul Kim, Sae Jin Kim, Zhiliang Xia, Je Hyun Lee
  • GRAIN ANALYZING METHOD AND SYSTEM USING HRTEM IMAGE
    Publication number: 20160267643
    Abstract: Provided are a method and system for analyzing grains using a high-resolution transmission electron microscopy (HRTEM) image. The method relates to analyzing nanometer grains, and includes receiving an HRTEM image, setting local windows each having a predetermined size for the HRTEM image, performing at least one Fast Fourier transformation on pixel data determined by the local windows to calculate local transformation data; and analyzing grains based on the local transformation data.
    Type: Application
    Filed: March 10, 2016
    Publication date: September 15, 2016
    Inventors: MIN CHUL PARK, DAE SIN KIM, SAT BYUL KIM, SAE JIN KIM, ZHILIANG XIA, JE HYUN LEE