Abstract: A scan chain collects scan chain data from testing of a functional circuit and outputs a scan chain signal containing the scan chain data. A voltage monitor circuit operates to compare a supply voltage against a threshold and assert a reset signal when the supply voltage crosses the threshold. The reset signal resets a flip flop circuit whose output signal controls operation of a logic circuit that blocks passage of the scan chain signal to an integrated circuit probe pad and instead applies a constant logic signal to the probe pad indicating a voltage monitoring error.

Abstract: A scan chain collects scan chain data from testing of a functional circuit and outputs a scan chain signal containing the scan chain data. A voltage monitor circuit operates to compare a supply voltage against a threshold and assert a reset signal when the supply voltage crosses the threshold. The reset signal resets a flip flop circuit whose output signal controls operation of a logic circuit that blocks passage of the scan chain signal to an integrated circuit probe pad and instead applies a constant logic signal to the probe pad indicating a voltage monitoring error.

Abstract: A system and method for testing an integrated circuit using methodologies to reduce voltage drop during ATPG and LBIST testing. In one embodiment, delay elements may be added to a clock circuit used to generate the various clock signals that trigger the switching of the various electronic components. In another embodiment, logic circuitry may be added to a clock generation circuit to isolate clock domains in order to enable a clock signal in each clock domain in a specific pattern. In yet another embodiment, capture phases for LBIST testing may be made to be asynchrounous within each capture phase, such that data capture for one LBIST partition may be timed different from other capture phases for other LBIST partitions. Finally, a further embodiment ATPG circuitry may also be partitioned such that logic circuitry only enables one (or less than all) ATPG partition at a time.

Abstract: A system and method for testing an integrated circuit using methodologies to reduce voltage drop during ATPG and LBIST testing. In one embodiment, delay elements may be added to a clock circuit used to generate the various clock signals that trigger the switching of the various electronic components. In another embodiment, logic circuitry may be added to a clock generation circuit to isolate clock domains in order to enable a clock signal in each clock domain in a specific pattern. In yet another embodiment, capture phases for LBIST testing may be made to be asynchrounous within each capture phase, such that data capture for one LBIST partition may be timed different from other capture phases for other LBIST partitions. Finally, a further embodiment ATPG circuitry may also be partitioned such that logic circuitry only enables one (or less than all) ATPG partition at a time.

Abstract: The present invention provides a method and system for controlling leakage power consumption at a System on Chip (SoC) level during a normal run or a boot-up mode. The leakage power reduction is achieved by incorporating a central programmable controller in the SoC architecture and test structures of idle SoC peripherals to place them into an Absolute Minimum Power consumption state with respect to static and dynamic power.

Abstract: The present invention provides a method and system for controlling leakage power consumption at a System on Chip (SoC) level during a normal run or a boot-up mode. The leakage power reduction is achieved by incorporating a central programmable controller in the SoC architecture and test structures of idle SoC peripherals to place them into an Absolute Minimum Power consumption state with respect to static and dynamic power.

Abstract: The present invention provides a method and system for controlling leakage power consumption at a System on Chip (SoC) level during a normal run or a boot-up mode. The leakage power reduction is achieved by incorporating a central programmable controller in the SoC architecture and test structures of idle SoC peripherals to place them into an Absolute Minimum Power consumption state with respect to static and dynamic power.

Abstract: The present invention provides a method and system for controlling leakage power consumption at a System on Chip (SoC) level during a normal run or a boot-up mode. The leakage power reduction is achieved by incorporating a central programmable controller in the SoC architecture and test structures of idle SoC peripherals to place them into an Absolute Minimum Power consumption state with respect to static and dynamic power.