Patents by Inventor Satish SAMBASIVAN

Satish SAMBASIVAN has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11886285
    Abstract: Technologies are disclosed herein for cross-correlating metrics for anomaly root cause detection. Primary and secondary metrics associated with an anomaly are cross-correlated by first using the derivative of an interpolant of data points of the primary metric to identify a time window for analysis. Impact scores for the secondary metrics can be then be generated by computing the standard deviation of a derivative of data points of the secondary metrics during the identified time window. The impact scores can be utilized to collect data relating to the secondary metrics most likely to have caused the anomaly. Remedial action can then be taken based upon the collected data in order to address the root cause of the anomaly.
    Type: Grant
    Filed: June 17, 2022
    Date of Patent: January 30, 2024
    Assignee: eBay Inc.
    Inventors: Maxwell Henry Poole, Satish Sambasivan, Vivek Siva Kaushik
  • Publication number: 20230359519
    Abstract: Technologies are disclosed herein for cross-correlating metrics for anomaly root cause detection. Primary and secondary metrics associated with an anomaly are cross-correlated by first using the derivative of an interpolant of data points of the primary metric to identify a time window for analysis. Impact scores for the secondary metrics can be then be generated by computing the standard deviation of a derivative of data points of the secondary metrics during the identified time window. The impact scores can be utilized to collect data relating to the secondary metrics most likely to have caused the anomaly. Remedial action can then be taken based upon the collected data in order to address the root cause of the anomaly.
    Type: Application
    Filed: June 17, 2022
    Publication date: November 9, 2023
    Applicant: eBay Inc.
    Inventors: Maxwell Henry POOLE, Satish SAMBASIVAN, Vivek Siva KAUSHIK
  • Publication number: 20220325392
    Abstract: Technologies are disclosed herein for cross-correlating metrics for anomaly root cause detection. Primary and secondary metrics associated with an anomaly are cross-correlated by first using the derivative of an interpolant of data points of the primary metric to identify a time window for analysis. Impact scores for the secondary metrics can be then be generated by computing the standard deviation of a derivative of data points of the secondary metrics during the identified time window. The impact scores can be utilized to collect data relating to the secondary metrics most likely to have caused the anomaly. Remedial action can then be taken based upon the collected data in order to address the root cause of the anomaly.
    Type: Application
    Filed: June 17, 2022
    Publication date: October 13, 2022
    Applicant: eBay Inc.
    Inventors: Maxwell Henry POOLE, Satish SAMBASIVAN, Vivek Siva KAUSHIK
  • Patent number: 11392446
    Abstract: Technologies are disclosed herein for cross-correlating metrics for anomaly root cause detection. Primary and secondary metrics associated with an anomaly are cross-correlated by first using the derivative of an interpolant of data points of the primary metric to identify a time window for analysis. Impact scores for the secondary metrics can be then be generated by computing the standard deviation of a derivative of data points of the secondary metrics during the identified time window. The impact scores can be utilized to collect data relating to the secondary metrics most likely to have caused the anomaly. Remedial action can then be taken based upon the collected data in order to address the root cause of the anomaly.
    Type: Grant
    Filed: March 15, 2019
    Date of Patent: July 19, 2022
    Assignee: eBay Inc.
    Inventors: Maxwell Henry Poole, Satish Sambasivan, Vivek Siva Kaushik
  • Publication number: 20200293391
    Abstract: Technologies are disclosed herein for cross-correlating metrics for anomaly root cause detection. Primary and secondary metrics associated with an anomaly are cross-correlated by first using the derivative of an interpolant of data points of the primary metric to identify a time window for analysis. Impact scores for the secondary metrics can be then be generated by computing the standard deviation of a derivative of data points of the secondary metrics during the identified time window. The impact scores can be utilized to collect data relating to the secondary metrics most likely to have caused the anomaly. Remedial action can then be taken based upon the collected data in order to address the root cause of the anomaly.
    Type: Application
    Filed: March 15, 2019
    Publication date: September 17, 2020
    Inventors: Maxwell Henry POOLE, Satish SAMBASIVAN, Vivek Siva KAUSHIK