Patents by Inventor Satoru NEBUYA

Satoru NEBUYA has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20160302690
    Abstract: An electrical impedance tomography (EIT) measurement device (1) includes a measurement belt (10) to which a plurality of electrode pads arranged in a row and a plurality of strain gauges arranged in parallel to the plurality of electrode pads are integrally adhered and configured to be used after being wrapped around a portion (X) serving as a measurement target of a living body, an EIT measurement control unit configured to acquire a tomographic image of the portion (X) serving as the measurement target while applying a current to the plurality of electrode pads and acquiring a voltage signal generated between the electrode pads, and a contour estimation unit configured to estimate a contour shape of the portion serving as the measurement target and a size of the contour shape on the basis of curvature data acquired via the strain gauge.
    Type: Application
    Filed: July 1, 2014
    Publication date: October 20, 2016
    Inventors: Satoru NEBUYA, So HIFUMI
  • Publication number: 20160235334
    Abstract: A length measurement device includes a tape portion (10) which is provided with a plurality of electrode pads (100a, 100b, 101a, 1010b, . . . ) arrayed thereon and is used in a state being wound around a measuring object, an impedance acquisition unit that selects any pair of electrode pads from a plurality of electrode pads and acquires electrical impedance between the pair of electrode pads, and a length calculation unit that calculates a length between the pair of electrode pads, based on a change in impedance of the pair of electrode pads.
    Type: Application
    Filed: September 19, 2014
    Publication date: August 18, 2016
    Inventor: Satoru NEBUYA