Abstract: A thermal spraying torch configured to spray a molten material onto a thermal sprayed surface of a work object and form a thermal sprayed coating has a discharge port configured to discharge the molten material, a discharge port periphery located on a peripheral edge of the discharge port on a front side in a discharge direction of the molten material and extending in the discharge direction, and an external surface continuous with a front end of the discharge port periphery. The discharge port periphery includes first section to which the molten material adheres more easily than to the external surface. The external surface includes a second section to which the molten material adheres less easily than to the discharge port periphery.

Abstract: A lighting fixture for attaching to an attachment component is provided. A lamp includes a light source that emits illumination light. A power supply includes a power supply circuit that generates power for causing the light source to emit the illumination light and a power supply housing that houses the power supply circuit. An arm couples the lamp and the power supply and rotatably supports the lamp. The power supply housing houses an infrared communication receiver that receives an infrared signal for controlling the lighting fixture and a radio communication circuit that receives a radio signal for controlling the lighting fixture. The power supply housing includes a first opening through which the infrared communication receiver receives the infrared signal.

Abstract: Provided is a defect detection device capable of measuring the volume of surface defects. The defect detection device includes: an imaging device configured to image an image of an inspection object; a binarization processing unit configured to subject the image to first and second binarization processing by use of different first and second binarization thresholds, so as to calculate first and second sizes for an identical defect in the image; a ratio calculation unit configured to calculate a first ratio of the second size to the first size; and a depth determination unit configured to determine a depth of the defect depending on the first ratio.

Abstract: A thermal spraying torch configured to spray a molten material onto a thermal sprayed surface of a work object and form a thermal sprayed coating has a discharge port configured to discharge the molten material, a discharge port periphery located on a peripheral edge of the discharge port on a front side in a discharge direction of the molten material and extending in the discharge direction, and an external surface continuous with a front end of the discharge port periphery. The discharge port periphery includes first section to which the molten material adheres more easily than to the external surface. The external surface includes a second section to which the molten material adheres less easily than to the discharge port periphery.

Abstract: A lighting fixture includes: a lamp that is configured to be recessed in an opening of a ceiling, and includes a light source that emits illumination light; and a power supply that is configured to be disposed behind the ceiling when the lighting fixture is in the opening of the ceiling, and generates power for causing the light source to emit the illumination light. The lamp includes an infrared communication receiver that receives an infrared signal for controlling the lighting fixture. The power supply includes a radio communication circuit that receives a radio signal for controlling the lighting fixture.

Abstract: A lighting fixture for attaching to an attachment component is provided. A lamp includes a light source that emits illumination light. A power supply includes a power supply circuit that generates power for causing the light source to emit the illumination light and a power supply housing that houses the power supply circuit. An arm couples the lamp and the power supply and rotatably supports the lamp. The power supply housing houses an infrared communication receiver that receives an infrared signal for controlling the lighting fixture and a radio communication circuit that receives a radio signal for controlling the lighting fixture. The power supply housing includes a first opening through which the infrared communication receiver receives the infrared signal.

Abstract: Provided is a defect detection device capable of measuring the volume of surface defects. The defect detection device includes: an imaging device configured to image an image of an inspection object; a binarization processing unit configured to subject the image to first and second binarization processing by use of different first and second binarization thresholds, so as to calculate first and second sizes for an identical defect in the image; a ratio calculation unit configured to calculate a first ratio of the second size to the first size; and a depth determination unit configured to determine a depth of the defect depending on the first ratio.

Abstract: Provided is a defect detection device capable of measuring the volume of surface defects. The defect detection device includes: an imaging device configured to image an image of an inspection object; a binarization processing unit configured to subject the image to first and second binarization processing by use of different first and second binarization thresholds, so as to calculate first and second sizes for an identical defect in the image; a ratio calculation unit configured to calculate a first ratio of the second size to the first size; and a depth determination unit configured to determine a depth of the defect depending on the first ratio.

Abstract: Provided is a defect detection device capable of measuring the volume of surface defects. The defect detection device includes: an imaging device configured to image an image of an inspection object; a binarization processing unit configured to subject the image to first and second binarization processing by use of different first and second binarization thresholds, so as to calculate first and second sizes for an identical defect in the image; a ratio calculation unit configured to calculate a first ratio of the second size to the first size; and a depth determination unit configured to determine a depth of the defect depending on the first ratio.