Abstract: According to one embodiment, a measuring method includes forming a partition including a lower portion arranged on a first surface side of a base and an upper portion protruding from a side surface of the lower portion, acquiring a first image including the partition, which is generated by emitting electromagnetic waves from the first surface side of the base or a second surface side opposed to the first surface of the base, analyzing the acquired first image, and measuring an amount of protrusion at which the end portion of the upper portion protrudes from the side surface of the lower portion, based on the analysis result.

Abstract: According to one embodiment, a measuring method includes forming a partition including a lower portion arranged on a first surface side of a base and an upper portion protruding from a side surface of the lower portion, acquiring a first image including the partition observed from a second surface side opposed to the first surface of the base by an optical microscope, analyzing the acquired first image, and measuring an amount of protrusion by which an end portion of the upper portion protrudes from the side surface of the lower portion, based on the analysis result.

Abstract: According to one embodiment, a measuring method includes forming a partition including a lower portion arranged on a base and an upper portion protruding from a side surface of the lower portion, acquiring a first image generated by detecting a secondary electron generated by emitting an electron beam including a primary electron to an area including at least a part of the side surface of the lower portion and at least a part of an end portion of the upper portion, analyzing the first image, and measuring an amount of protrusion by which the end portion of the upper portion protrudes from the side surface of the lower portion, based on the analysis result.

Abstract: A yeast extract is produced by preparing a suspension containing yeast, applying an electric field treatment to the suspension, and then autolyzing the suspension. In this electric field treatment, a voltage to be applied is less than 1000 V/mm, and a temperature of the suspension during an application period of the voltage is 64° C. or less. According to such a production process, a content of amino acids in the yeast extract can be improved. Among amino acids, branched chain amino acids or the like can be efficiently increased.

Abstract: According to one embodiment, an inspection device of a display device, includes a first probe block which includes first probes, a probe block attachment which supports the first probe block to enable a position of the first probe block to be set variably, a signal source which supplies a signal to the first probes, and a transmission cable which connects the first probe block with the signal source.

Abstract: A yeast extract is produced by preparing a suspension containing yeast, applying an electric field treatment to the suspension, and then autolyzing the suspension. In this electric field treatment, a voltage to be applied is less than 1000 V/mm, and a temperature of the suspension during an application period of the voltage is 64° C. or less. According to such a production process, a content of amino acids in the yeast extract can be improved. Among amino acids, branched chain amino acids or the like can be efficiently increased.

Abstract: According to one embodiment, an inspection device of a display device, includes a first probe block which includes first probes, a probe block attachment which supports the first probe block to enable a position of the first probe block to be set variably, a signal source which supplies a signal to the first probes, and a transmission cable which connects the first probe block with the signal source.

Abstract: According to one embodiment, a display device includes a display pixel allocated at a matrix state in a display area, an image-reading device which detects strength of capacitive coupling by a dielectric material coming close to or making contact with the display area, and a control portion which controls each transistor of the image-reading device. The image-reading device includes a detection electrode which forms capacitance between the detection electrode and the dielectric material, a pre-charge gate line, a coupling pulse line, a readout gate line, a pre-charge line and a readout line. These lines supply a signal which drives the image-reading device. The image-reading device further includes a pre-charge transistor, an amplification transistor, a readout transistor, a compensation transistor, and a power-source switching transistor.

Abstract: According to one embodiment, a display device includes a display pixel allocated at a matrix state in a display area, an image-reading device which detects strength of capacitive coupling by a dielectric material coming close to or making contact with the display area, and a control portion which controls each transistor of the image-reading device. The image-reading device includes a detection electrode which forms capacitance between the detection electrode and the dielectric material, a pre-charge gate line, a coupling pulse line, a readout gate line, a pre-charge line and a readout line. These lines supply a signal which drives the image-reading device. The image-reading device further includes a pre-charge transistor, an amplification transistor, a readout transistor, a compensation transistor, and a power-source switching transistor.

Abstract: In one embodiment, a display device having a touch function includes an insulating substrate and a plurality of pixels formed on the insulating substrate and arranged in a matrix of rows and columns. The pixels form a plurality of pixel blocks formed of a plurality of rows and columns of the pixels. A sensor circuit is arranged in a space between adjacent pixels on the insulating substrate and includes a coupling electrode, a detection electrode arranged adjacent to the coupling electrode for forming a coupling capacitance therebetween, and a reading-out circuit to read out a potential of the detection electrode. At least one sensor circuit is arranged in each pixel block. The contact or non-contact by a fingertip or a nib is detected by a potential difference of the detection electrode.

Abstract: According to one embodiment, a sensor module includes a first sensor circuit, a second sensor circuit and a differential circuit. The first sensor circuit includes a first detection electrode, a first amplifier formed of a thin-film transistor and a first coupling capacitor. The second sensor circuit includes a second detection electrode, a second amplifier formed of a thin-film transistor and a second coupling capacitor. The differential circuit is connected to the drain electrode of the first amplifier and the drain electrode of the second amplifier.

Abstract: According to one embodiment, a display device includes a display pixel allocated at a matrix state in a display area, an image-reading device which detects strength of capacitive coupling by a dielectric material coming close to or making contact with the display area, and a control portion which controls each transistor of the image-reading device. The image-reading device includes a detection electrode which forms capacitance between the detection electrode and the dielectric material, a pre-charge gate line, a coupling pulse line, a readout gate line, a pre-charge line and a readout line. These lines supply a signal which drives the image-reading device. The image-reading device further includes a pre-charge transistor, an amplification transistor, a readout transistor, a compensation transistor, and a power-source switching transistor.

Abstract: According to one embodiment, a display device includes, a module which divides a display surface of the display device into a plurality of regions composed of a plurality of display pixels and a plurality of sensor circuits and which causes a part of the sensors in each of the regions to perform a normal operation of reading the magnitude of capacitive coupling, a module which causes the other sensor circuits in the same region to perform a correction operation of not reading the magnitude of capacitive coupling, and a module which determines the magnitude of capacitive coupling using the difference between output signals from the sensor circuits that perform the normal operation in the corresponding regions and output signals from the sensor circuits that perform the correction operation.

Abstract: According to one embodiment, a sensor module includes a first sensor circuit, a second sensor circuit and a differential circuit. The first sensor circuit includes a first detection electrode, a first amplifier formed of a thin-film transistor and a first coupling capacitor. The second sensor circuit includes a second detection electrode, a second amplifier formed of a thin-film transistor and a second coupling capacitor. The differential circuit is connected to the drain electrode of the first amplifier and the drain electrode of the second amplifier.

Abstract: In one embodiment, a display device having a touch function includes an insulating substrate and a plurality of pixels formed on the insulating substrate and arranged in a matrix of rows and columns. The pixels form a plurality of pixel blocks formed of a plurality of rows and columns of the pixels. A sensor circuit is arranged in a space between adjacent pixels on the insulating substrate and includes a coupling electrode, a detection electrode arranged adjacent to the coupling electrode for forming a coupling capacitance therebetween, and a reading-out circuit to read out a potential of the detection electrode. At least one sensor circuit is arranged in each pixel block. The contact or non-contact by a fingertip or a nib is detected by a potential difference of the detection electrode.

Abstract: A testing method for an array substrate is disclosed which includes a first measuring step of operating a line electrode driver circuit 15 and a row electrode driver circuit 16 like in a normal display mode while implementing writing in/reading out of a test video signal to and from supplemental capacitors 13, and a second measuring step of implementing writing in/reading out of the test video signals to and from a video bus 163 while rendering TFTs 11 of a pixel section 18 and analog switches 162 of the row electrode driver circuit 16 to be held turned off. Obtaining a difference between a measured result of the first measuring step and a measured result of the second measuring step allows only a pixel component and a row electrode component with no driver component to be derived, whereupon discrimination is implemented for the presence of or the absence of electric defects in the pixel section.

Abstract: An image forming apparatus including a unit including image carriers for carrying electrostatic latent images, respectively, and developing devices for developing the electrostatic latent images with toners, respectively, and integrated with the image carriers, and toner feeding devices for feeding the toners to the developing devices, respectively, and provided separately from the unit, wherein the toner feeding devices and developing devices are detachably engaged with each other.

Abstract: A testing method for an array substrate is disclosed which includes a first measuring step of operating a line electrode driver circuit 15 and a row electrode driver circuit 16 like in a normal display mode while implementing writing in/reading out of a test video signal to and from supplemental capacitors 13, and a second measuring step of implementing writing in/reading out of the test video signals to and from a video bus 163 while rendering TFTs 11 of a pixel section 18 and analog switches 162 of the row electrode driver circuit 16 to be held turned off. Obtaining a difference between a measured result of the first measuring step and a measured result of the second measuring step allows only a pixel component and a row electrode component with no driver component to be derived, whereupon discrimination is implemented for the presence of or the absence of electric defects in the pixel section.

Abstract: A testing method for an array substrate is disclosed which includes a first measuring step of operating a line electrode driver circuit 15 and a row electrode driver circuit 16 like in a normal display mode while implementing writing in/reading out of a test video signal to and from supplemental capacitors 13, and a second measuring step of implementing writing in/reading out of the test video signals to and from a video bus 163 while rendering TFTs 11 of a pixel section 18 and analog switches 162 of the row electrode driver circuit 16 to be held turned off. Obtaining a difference between a measured result of the first measuring step and a measured result of the second measuring step allows only a pixel component and a row electrode component with no driver component to be derived, whereupon discrimination is implemented for the presence of or the absence of electric defects in the pixel section.

Abstract: A method for inspecting a substrate comprising a mother substrate, a first array area and a second array area which are formed on the mother substrate and opposed to each other with respect to a line intended for division, and each of which includes scanning lines, signal lines, switching elements close to intersections of the scanning lines and the signal lines, and pixel electrodes connected to the switching elements, the method comprising radiating electron beams onto a radiation area which includes at least part of the first array area and at least part of the second array area, with a relative positional relationship between the mother substrate and the beam source being fixed at the same time, detecting secondary electrons radiated from the pixel electrodes, and inspecting with respect to whether the pixel electrodes are defective or not based on the detected secondary electrons.