Patents by Inventor Satoshi Habu

Satoshi Habu has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7481083
    Abstract: A drum type washing and drying machine includes a rotary drum provided with drum perforations on the cylindrical surface thereof, a water tub elastically supported in a main body of the machine, for accommodating the rotary drum, a blower unit for circulating air into the rotary drum, a heating unit for heating the air to be circulated into the rotary drum, an air flow passage for directing air, which has been exhausted from the rotary drum into a space between the water tub and the rotary drum through the drum perforations, to the blower unit, a heat exchanging member installed in the air flow passage, and a cooling water supply unit for supplying cooling water to the heat-exchanging member. The heat-exchanging member is slantingly disposed in the air flow passage and has an upper and a lower surface and to form an approximately U-shaped heat exchanging path.
    Type: Grant
    Filed: July 22, 2005
    Date of Patent: January 27, 2009
    Assignee: Matsushita Electric Industrial Co., Ltd.
    Inventors: Satoshi Habu, Koji Nakai, Takahiro Inoue
  • Publication number: 20070050170
    Abstract: In measuring characteristics of a device such as PRAM, inputted pulse signal is made blunt and a voltage applied to the device and a current flowing through the device cannot be precisely measured. To solve these problems, the present invention provides a resistor for making a voltage drop of a signal outputted from the pulse generator. The active differential probe outputs a signal corresponding to a potential difference between the both ends of the resistor. The signal is inputted to an oscilloscope.
    Type: Application
    Filed: August 24, 2006
    Publication date: March 1, 2007
    Inventors: Michitoshi Noguchi, Satoshi Habu
  • Publication number: 20060096334
    Abstract: A drum type washing and drying machine includes a rotary drum provided with drum perforations on the cylindrical surface thereof, a water tub elastically supported in a main body of the machine, for accommodating the rotary drum, a blower unit for circulating air into the rotary drum, a heating unit for heating the air to be circulated into the rotary drum, an air flow passage for directing air, which has been exhausted from the rotary drum into a space between the water tub and the rotary drum through the drum perforations, to the blower unit, a heat exchanging member installed in the air flow passage, and a cooling water supply unit for supplying cooling water to the heat-exchanging member. The heat-exchanging member is slantingly disposed in the air flow passage and has an upper and a lower surface and to form an approximately U-shaped heat exchanging path.
    Type: Application
    Filed: July 22, 2005
    Publication date: May 11, 2006
    Applicant: Matsushita Electrick Industrial Co., Ltd.
    Inventors: Satoshi Habu, Koji Nakai, Takahiro Inoue
  • Patent number: 5903143
    Abstract: This invention is an inexpensive probe apparatus operating at high precision that can be used for both low-frequency and high-frequency measurements. A line with a first and second conductor is extended from a probe connected to a circuit component. A low-frequency or high-frequency device is alternately connected to the line. A third common conductor runs parallel to the aforementioned line and a resistor and capacitor is connected between the probe end of the aforementioned second conductor and the aforementioned common conductor.
    Type: Grant
    Filed: June 3, 1997
    Date of Patent: May 11, 1999
    Assignee: Hewlett-Packard Company
    Inventors: Kohei Mochizuki, Satoshi Habu
  • Patent number: 5680039
    Abstract: This invention is an inexpensive probe apparatus operating at high precision that can be used for both low-frequency and high-frequency measurements. A line with a first and second conductor is extended from a probe connected to a circuit component. A low-frequency or high-frequency device is alternately connected to the line. A third common conductor runs parallel to the aforementioned line and a resistor and capacitor is connected between the probe end of the aforementioned second conductor and the aforementioned common conductor.
    Type: Grant
    Filed: February 2, 1995
    Date of Patent: October 21, 1997
    Assignee: Hewlett-Packard Company
    Inventors: Kohei Mochizuki, Satoshi Habu
  • Patent number: 5493070
    Abstract: A cable is provided that is suitable for Kelvin connection and a measuring system for using the cable. The cable comprises a central conductor for current supply to an object to be measured, a voltage detection conductor insulated and located close to the central conductor, a tubular guarding conductor surrounding the above two conductors covered by insulating material and a tubular conductor for a reference potential surrounding the above-mentioned conductors (as covered by an insulating material).
    Type: Grant
    Filed: June 20, 1994
    Date of Patent: February 20, 1996
    Assignee: Hewlett-Packard Company
    Inventor: Satoshi Habu
  • Patent number: 5406217
    Abstract: The present invention relates to a method of measuring the current-voltage characteristics of a DUT by controlling a voltage source and current source of the measurement apparatus by changing a predetermined current value in the current source or a predetermined voltage value in the voltage source in response to an output characteristic. For example, in utilizing a voltage source, the output current limiting value is incremented by a predetermined amount when the current output of a DUT reaches the current limiting value before the voltage output reaches a desired value. The current and voltage outputs of the DUT do not change unless the current limiting value is first incremented. Thus, the output characteristics with a rapid change in the DUT are more accurately measured by controlling the input and output of the DUT.
    Type: Grant
    Filed: July 24, 1992
    Date of Patent: April 11, 1995
    Assignee: Hewlett-Packard Company
    Inventor: Satoshi Habu