Patents by Inventor Satoshi Imaizumi
Satoshi Imaizumi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20060023161Abstract: An eye refractive power measurement apparatus capable of accurate measurement while preventing noise light from entering a photodetector even a measurement target is moved in an optical-axis direction, has a measurement optical system including an optical axis, a hole mirror having an aperture and a reflective surface, a concave mirror, an optical system projecting measurement light from the target onto a fundus via the aperture and the concave mirror, and an optical system having an image-forming member and the photodetector photo-receiving the light reflected from the fundus via the concave mirror, the reflective surface and the image-forming member, a unit moving the target and the image-forming member or photodetector in the direction to have a positional relationship optically conjugate with the fundus, and a calculation part obtaining eye refractive power based on a travel position or amount of the image-forming member or photodetector and an output from the photodetector.Type: ApplicationFiled: July 26, 2005Publication date: February 2, 2006Applicant: NIDEK CO., LTD.Inventor: Satoshi Imaizumi
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Publication number: 20050219514Abstract: A lens meter for measuring optical characteristics of a subject lens to be measured includes at least three light sources for measurement, a projecting lens which projects measurement light bundles from the light sources onto the subject lens placed on a projecting-lens optical axis, a diaphragm having an aperture disposed at a posterior focal point of the projecting lens between the light sources and the projecting lens, and a two-dimensional photodetector photo-receiving the light bundles passing through the subject lens after passing through the aperture of the diaphragm and the projecting lens without the use of an image forming optical system, and the projecting lens is disposed so that the light sources is conjugate with the photodetector in a case where the subject lens with a specific diopter in the vicinity of 0D or a frequently-used specific diopter is placed on the optical axis.Type: ApplicationFiled: March 28, 2005Publication date: October 6, 2005Applicant: NIDEK CO., LTD.Inventor: Satoshi Imaizumi
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Patent number: 6914932Abstract: Received level measurement circuit 1071 performs received level measurement using input despread traffic channel data. Received level measurement circuit 1072 performs received level measurement using input despread common control channel data. These received levels are respectively output from received level measurement circuits 1071 and 1072 to correlation circuit 1075. Correlation circuit 175 first performs correlation calculation between paths in respective profiles of the traffic channel and common control channel each generated based on respective received level. Based on the result of the correlation calculation, path selection is performed to determine a reception timing.Type: GrantFiled: June 27, 2000Date of Patent: July 5, 2005Assignee: Matsushita Electric Industrial Co., Ltd.Inventors: Kazuyuki Miya, Satoshi Imaizumi
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Publication number: 20050046866Abstract: A surface inspection apparatus for inspecting a surface of an object to be inspected, includes: a projecting optical system which projects an inspection light to the object surface via a reference surface; a pick up unit which picks up surface interference fringes formed by reflected light from the reference surface and reflected light from the object surface; and an arithmetic unit which calculates a shape of the surface of the object based on the picked up interference fringes. The projecting optical system includes a laser light source that emits, as the inspection light, pulsed laser light having a pulse width and a pulse quiescent time capable of preventing formation of rear face interference fringes which are formed by the reflected light from the object surface and reflected light caused by the inspection light being reflected from its rear face, the object allowing the inspection light to pass therethrough.Type: ApplicationFiled: July 29, 2004Publication date: March 3, 2005Inventors: Takahiro Miura, Satoshi Imaizumi
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Patent number: 6829291Abstract: A correlation calculating section 103 calculates correlation values from a baseband signal from a radio receiving section 102. A delay profile generating section 105 generates a delay profile based on the correlation value from a selecting section 104. A peak detecting section 106 detects a peak correlation value and a peak phase from the delay profile, outputs the peak correlation value to a weighting section 109, and also outputs the peak phase to a correlation phase adjusting section 107 and a demodulation control section 111. A correlation phase adjusting section 107 adjusts a phase of a spreading code auto-correlation value in accordance with the peak phase, and the weighting section 109 adjusts amplitude of the spreading code auto-correlation value subjected to phase adjustment in accordance with the peak correlation value. A correlation eliminating section 110 eliminates the spreading code auto-correlation values subjected to phase adjustment from the correlation values.Type: GrantFiled: December 18, 2000Date of Patent: December 7, 2004Assignee: Matsushita Electric Industrial Co., Ltd.Inventor: Satoshi Imaizumi
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Publication number: 20040172106Abstract: An ablation apparatus capable of obtaining intensity distribution in a concave shape at an irradiation surface even when a laser beam goes through a small opening of an aperture to be formed into a small spot. In the apparatus, a laser light source emits the beam which effects ablation to the object, an irradiation optical system directs and irradiates the beam onto an irradiation surface of the object, an aperture in the system has an opening, a convex lens in the system once collects the beam passed through the opening and directs the beam onto the surface at a defocus position, and an aspherical optical element in the system makes intensity distribution of the beam after passing through the opening to be convex, wherein an aspherical shape of the element is curved where a radius of curvature at a local surface is reduced toward a periphery from an optical axis.Type: ApplicationFiled: October 21, 2003Publication date: September 2, 2004Inventor: Satoshi Imaizumi
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Patent number: 6765684Abstract: A surface shape measurement apparatus for measuring a shape of an object to be examined by a simple mechanism for rotating a reference grid. The apparatus comprises a stage on which the object is rested, a reference grid disposed in parallel to the stage, illumination means for illuminating the reference grid and projecting an grid pattern onto the object surface, photographing means for photographing the grid pattern projected onto the object surface through the reference grid and obtaining an image of moiré fringes, rotation means for rotating the reference grid about an axis normal to a grid surface of the grid plate, and analysis means for analyzing the shape of the object surface based on information about a rotation angle of the reference grid and intensity of the moiré fringes.Type: GrantFiled: March 27, 2002Date of Patent: July 20, 2004Assignee: Nidek Co., LtdInventor: Satoshi Imaizumi
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Patent number: 6679876Abstract: The present invention is intended to provide a corneal surgery apparatus which enables a surgical operator to accurately ablate a cornea in part. The corneal surgery apparatus for ablating part of a cornea by irradiating a laser beam onto the cornea of a patient's eye comprises an irradiation optical system for irradiating the laser beam emitted from a laser light source onto the cornea, an aperture, which is disposed in the irradiation optical system, profiling a cross-sectional region of the beam perpendicular to an optical axis of the irradiation into one or more small regions, and correcting device for correcting an intensity distribution of the laser beam, which is changed when the beam passes through the aperture, to a specified intensity distribution.Type: GrantFiled: October 22, 2001Date of Patent: January 20, 2004Assignee: Nidek Co., Ltd.Inventors: Naoyuki Kondo, Kazunobu Kojima, Satoshi Imaizumi
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Patent number: 6487237Abstract: A preliminary selection averaging section 105 averages a small number of correlation values, a candidate code selecting section 106 selects some spreading codes, each having a high average correlation value, as candidates of a real spreading code, an actual selection averaging section 107 performs the averaging the correlation values of the respective candidate codes by use of the number of correlation values necessary for sufficiently restraining noise, and a maximum value detecting section 108 estimates a spreading code, having a maximum correlation value, as a real spreading code. Thereby, time for an initial synchronization can be reduced without decreasing the accuracy of the spreading code estimation.Type: GrantFiled: January 20, 1999Date of Patent: November 26, 2002Assignee: Matsushita Electric Industrial Co., Ltd.Inventor: Satoshi Imaizumi
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Publication number: 20020163651Abstract: A surface shape measurement apparatus for measuring a shape of a surface of an object to be examined by a simple mechanism for rotating a reference grid. The apparatus comprises a stage on which the object is rest, a reference grid disposed in parallel to the stage, illumination means for illuminating the reference grid and projecting an grid pattern onto the object surface, photographing means for photographing the grid pattern projected onto the object surface through the reference grid and obtaining an image of moiré fringes, rotation means for rotating the reference grid about an axis normal to a grid surface of the grid plate, and analysis means for analyzing the shape of the object surface based on information about a rotation angle of the reference grid and intensity of the moiré fringes.Type: ApplicationFiled: March 27, 2002Publication date: November 7, 2002Applicant: NIDEK CO., LTD.Inventor: Satoshi Imaizumi
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Publication number: 20020154714Abstract: Changeover control section 201 controls changeover operations of switch 202, switch 203 and symbols Dplus's including only +A are sorted and output to the memory 204 side and symbols Dminus's including −A are sorted and output to the memory 205 side, memory 204 and adder 206 perform in-phase additions between Dplus's and memory 205 and adder 206 perform in-phase additions between Dminus's and square addition section 207 calculates the squares of Dplus's after the in-phase addition and the squares of Dminus's after the in-phase addition and then adds up the squared Dplus's and Dminus's.Type: ApplicationFiled: April 5, 2002Publication date: October 24, 2002Inventors: Koichi Aihara, Hidetoshi Suzuki, Satoshi Imaizumi, Junji Somon
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Publication number: 20020137513Abstract: In a correlation circuit 103, a correlation value is obtained by despreading processing of a reception signal. The above correlation value is sent to a cell detection circuit 104 and a cell monitoring circuit 105. The above results of cell detection and cell monitoring are sent to a cell management table 106 for classification and management of cells. A management circuit 107 changes the cycle for cell monitoring/cell detection according to various kinds of events, and, then, gives an instruction for cell detection and cell monitoring at the changed cycle to the cell detection circuit 104 and the cell monitoring circuit 105.Type: ApplicationFiled: October 15, 2001Publication date: September 26, 2002Inventors: Koichi Aihara, Kazuo Morimura, Hidetoshi Suzuki, Masatoshi Watanabe, Satoshi Imaizumi
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Publication number: 20020122557Abstract: A first-stage processing section 105 detects a plurality of slot timings corresponding to a plurality of correlation values equal to or greater than a threshold value, a second-stage processing section 110 detects scrambling code timing and a scrambling code group in accordance with one of the slot timings, a third-stage processing section 115 identifies a scrambling code in accordance with the scrambling code timing, and a controller 104 switches a switch 103 so that processing by the second-stage processing section 110 and processing by the third-stage processing section 115 are executed for a plurality of slot timings each time processing by the first-stage processing section 105 is executed once.Type: ApplicationFiled: February 7, 2002Publication date: September 5, 2002Inventors: Koichi Aihara, Junji Somon, Satoshi Imaizumi, Noriaki Minamida, Hidetoshi Suzuki
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Publication number: 20020049430Abstract: The present invention is intended to provide a corneal surgery apparatus which enables a surgical operator to accurately ablate a cornea in part. The corneal surgery apparatus for ablating part of a cornea by irradiating a laser beam onto the cornea of a patient's eye comprises an irradiation optical system for irradiating the laser beam emitted from a laser light source onto the cornea, an aperture, which is disposed in the irradiation optical system, profiling a cross-sectional region of the beam perpendicular to an optical axis of the irradiation into one or more small regions, and correcting device for correcting an intensity distribution of the laser beam, which is changed when the beam passes through the aperture, to a specified intensity distribution.Type: ApplicationFiled: October 22, 2001Publication date: April 25, 2002Inventors: Naoyuki Kondo, Kazunobu Kojima, Satoshi Imaizumi