Patents by Inventor Satoshi Kowatari

Satoshi Kowatari has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7840924
    Abstract: A verification apparatus that can verify a circuit in a shorter time while taking possible metastability into consideration. A clock domain crossing (CDC) detector finds CDC paths between circuit elements operating with different clocks in the circuit. A delay generator inserter produces a delay-insertable version of the circuit by embedding a delay generator into each found CDC path. When activated, those delay generators give a signal delay to the corresponding CDC paths. A simulator simulates the behavior of the delay-insertable circuit by using a specified simulation pattern while deactivating the embedded delay generators. A delay pattern generator creates a delay pattern from simulation results, which activates or deactivates delay generators individually so as to produce signal delays that could affect output signals of the circuit. A verifier verifies the circuit by applying the delay pattern to each delay generator in the circuit.
    Type: Grant
    Filed: January 22, 2008
    Date of Patent: November 23, 2010
    Assignee: Fujitsu Semiconductor Limited
    Inventor: Satoshi Kowatari
  • Patent number: 7676777
    Abstract: A verification support apparatus receives description data. Upon receiving the description data, the apparatus automatically generates and outputs a verification property, a verification scenario, specification data, review information, etc. In addition, the apparatus checks the description data for any element of deficiency or inconsistency before the automatic generation of the verification property. Therefore, the amount of description data can be reduced by sorting out the types of verification items and listing parameters, and various verification properties can be automatically generated by allowing a computer to read verification data. Furthermore, a design TAT can be reduced by generating the specification data. Furthermore, even a designer not familiar with a verification language such as PSL can easily execute assertion-based verification.
    Type: Grant
    Filed: March 27, 2007
    Date of Patent: March 9, 2010
    Assignee: Fujitsu Microelectronics Limited
    Inventors: Satoshi Kowatari, Yoshiro Nakamura, Takako Shindo
  • Publication number: 20080198957
    Abstract: A verification apparatus that can verify a circuit in a shorter time while taking possible metastability into consideration. A clock domain crossing (CDC) detector finds CDC paths between circuit elements operating with different clocks in the circuit. A delay generator inserter produces a delay-insertable version of the circuit by embedding a delay generator into each found CDC path. When activated, those delay generators give a signal delay to the corresponding CDC paths. A simulator simulates the behavior of the delay-insertable circuit by using a specified simulation pattern while deactivating the embedded delay generators. A delay pattern generator creates a delay pattern from simulation results, which activates or deactivates delay generators individually so as to produce signal delays that could affect output signals of the circuit. A verifier verifies the circuit by applying the delay pattern to each delay generator in the circuit.
    Type: Application
    Filed: January 22, 2008
    Publication date: August 21, 2008
    Applicant: FUJITSU LIMITED
    Inventor: Satoshi KOWATARI
  • Patent number: 7401306
    Abstract: A verification support apparatus verifies an object. The object includes a plurality of clock domains and each clock domain includes a plurality of registers. The verification support apparatus includes an input receiving unit that receives logical circuit description information on the object; a specifying unit that specifies at least two registers in one clock domain that output data to an adjacent clock domain; and a detecting unit that detects, based on the logical circuit description information and specified registers, a re-convergence register in the adjacent clock domain that achieves convergence.
    Type: Grant
    Filed: October 20, 2005
    Date of Patent: July 15, 2008
    Assignee: Fujitsu Limited
    Inventor: Satoshi Kowatari
  • Publication number: 20070234249
    Abstract: A verification support apparatus receives description data. Upon receiving the description data, the apparatus automatically generates and outputs a verification property, a verification scenario, specification data, review information, etc. In addition, the apparatus checks the description data for any element of deficiency or inconsistency before the automatic generation of the verification property. Therefore, the amount of description data can be reduced by sorting out the types of verification items and listing parameters, and various verification properties can be automatically generated by allowing a computer to read verification data. Furthermore, a design TAT can be reduced by generating the specification data. Furthermore, even a designer not familiar with a verification language such as PSL can easily execute assertion-based verification.
    Type: Application
    Filed: March 27, 2007
    Publication date: October 4, 2007
    Applicant: FUJITSU LIMITED
    Inventors: Satoshi Kowatari, Yoshiro Nakamura, Takako Shindo
  • Publication number: 20060206846
    Abstract: A verification support apparatus verifies an object. The object includes a plurality of clock domains and each clock domain includes a plurality of registers. The verification support apparatus includes an input receiving unit that receives logical circuit description information on the object; a specifying unit that specifies at least two registers in one clock domain that output data to an adjacent clock domain; and a detecting unit that detects, based on the logical circuit description information and specified registers, a re-convergence register in the adjacent clock domain that achieves convergence.
    Type: Application
    Filed: October 20, 2005
    Publication date: September 14, 2006
    Applicant: FUJITSU LIMITED
    Inventor: Satoshi Kowatari
  • Publication number: 20030115554
    Abstract: Information of definitions on interface specifications capable of expressing parallel behaviors is stored in a computer-readable storage medium while amounts of information are reduced. The present invention comprises: a first identifier region for storing, as a first set of ports, combination patterns of signal values that respective ports of a first set of ports are capable of assuming; a second identifier region for storing, as a second set of ports, combination patterns of signal values that respective ports of a second set of ports are capable of assuming; and a third identifier region for storing, as a third set of ports, functions of a circuit module defined as combinations of first identifiers and second identifiers, wherein the third identifiers include codes (par) indicating that starting order of combination patterns corresponding to the first identifiers and combination patterns corresponding to the second identifiers are undefined.
    Type: Application
    Filed: November 18, 2002
    Publication date: June 19, 2003
    Applicant: Hitachi, Ltd.
    Inventors: Koji Ara, Kei Suzuki, Tsuneo Nakata, Hiroaki Iwashita, Satoshi Kowatari
  • Patent number: 5708594
    Abstract: First, an initial operation model M.sub.0 of a pipeline is configured according to the pipeline configuration of a processor and the specification information about an instruction executed by the processor. Then, the number of the states of the initial operation model M.sub.0 is minimized to configure an operation model M. Based on the operation model M and a test state set H, listed are test instruction strings for the process in which the state of the operation model M indicates a transition from a predetermined input state to any of the test states contained in the test state set H without an occurrence of a conflict in the operation model M. A next time state, reached after the state of the operation model M has reached the test state of the test instruction string, is calculated and the next time state is input as a new input state to a test instruction string listing unit.
    Type: Grant
    Filed: May 3, 1995
    Date of Patent: January 13, 1998
    Assignee: Fujitsu Limited
    Inventors: Hiroaki Iwashita, Satoshi Kowatari, Tsuneo Nakata, Fumiyasu Hirose