Patents by Inventor Satyaki Ganguly

Satyaki Ganguly has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • System and process for implementing accelerated test conditions for high voltage lifetime evaluation of semiconductor power devices
    Patent number: 11175333
    Abstract: A process and system for testing includes: arranging devices in a temperature-controlled environment; applying a negative gate bias voltage (Vgs) to the devices; applying a drain voltage (Vds) to the devices; measuring currents and/or voltages of the devices to generate device test data; determining a failure of one or more of the devices based on the device test data generated from the device currents and/or the voltages to generate failure data; and outputting the failure data for the of devices.
    Type: Grant
    Filed: March 2, 2020
    Date of Patent: November 16, 2021
    Assignee: CREE, INC.
    Inventors: Daniel Jenner Lichtenwalner, Satyaki Ganguly
  • System and Process for Implementing Accelerated Test Conditions for High Voltage Lifetime Evaluation of Semiconductor Power Devices
    Publication number: 20210270886
    Abstract: A process and system for testing includes: arranging devices in a temperature-controlled environment; applying a negative gate bias voltage (Vgs) to the devices; applying a drain voltage (Vds) to the devices; measuring currents and/or voltages of the devices to generate device test data; determining a failure of one or more of the devices based on the device test data generated from the device currents and/or the voltages to generate failure data; and outputting the failure data for the of devices.
    Type: Application
    Filed: March 2, 2020
    Publication date: September 2, 2021
    Inventors: Daniel Jenner Lichtenwalner, Satyaki Ganguly