Patents by Inventor Saurabh Chauhan

Saurabh Chauhan has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8458541
    Abstract: Scan chains are used to detect faults in integrated circuits but with the size of today's circuits, it is difficult to detect and locate scan chain faults, especially when the scan data in and scan data out have been compressed. A method for debugging scan chains includes selecting a scan chain for debugging using a scan chain selection block and then providing scan test vectors to the selected scan chain. The scan test vectors undergo various scan test stages to generate scan response vectors. The scan response vectors are compared with ideal response vectors to identify a failing scan chain.
    Type: Grant
    Filed: March 25, 2011
    Date of Patent: June 4, 2013
    Assignee: Freescale Semiconductor, Inc.
    Inventors: Sandeep Jain, Nikila Krishnamoorthy, Abhishek Chaudhary, Nipun Mahajan, Saurabh Chauhan
  • Publication number: 20120246531
    Abstract: Scan chains are used to detect faults in integrated circuits but with the size of today's circuits, it is difficult to detect and locate scan chain faults, especially when the scan data in and scan data out have been compressed. A method for debugging scan chains includes selecting a scan chain for debugging using a scan chain selection block and then providing scan test vectors to the selected scan chain. The scan test vectors undergo various scan test stages to generate scan response vectors. The scan response vectors are compared with ideal response vectors to identify a failing scan chain.
    Type: Application
    Filed: March 25, 2011
    Publication date: September 27, 2012
    Applicant: FREESCALE SEMICONDUCTOR, INC
    Inventors: Sandeep Jain, Nikila Krishnamoorthy, Abhishek Chaudhary, Nipun Mahajan, Saurabh Chauhan