Abstract: Aspects of the disclosure relate to a hybrid metaverse environment. A computing platform may synchronize, using edge nodes and with a physical repository server, a soft document repository. The computing platform may receive, via a metaverse application interface, an event processing request. The computing platform may identify, based on the event processing request and using a machine learning model, documents needed to execute the event processing request. The computing platform may update a request queue to identify the event processing request and the documents. The computing platform may access, using an edge node and via the soft document repository, the physical repository server to obtain document images corresponding to the identified documents, and may update a response queue to include the obtained document images. The computing platform may send, to an enterprise user device, a haptic alert indicating that the event processing request is ready for processing.

Abstract: An apparatus for using a validated card in a virtual environment comprises a processor associated with a server. The processor is configured to receive a request to conduct an interaction between a first avatar and an entity in a virtual environment. The processor is further configured to receive card information and device information from an unknown user device. The processor is further configured to verify that the unknown user device is a first user device. The processor is further configured to receive virtual session information that is associated with a virtual environment session. The processor is further configured to determine if the request to conduct the interaction occurred in the same virtual environment session as the reception of the card information. The processor is further configured to conduct the interaction between the first avatar and the entity with the received card information.

Abstract: Scan chains are used to detect faults in integrated circuits but with the size of today's circuits, it is difficult to detect and locate scan chain faults, especially when the scan data in and scan data out have been compressed. A method for debugging scan chains includes selecting a scan chain for debugging using a scan chain selection block and then providing scan test vectors to the selected scan chain. The scan test vectors undergo various scan test stages to generate scan response vectors. The scan response vectors are compared with ideal response vectors to identify a failing scan chain.

Abstract: Scan chains are used to detect faults in integrated circuits but with the size of today's circuits, it is difficult to detect and locate scan chain faults, especially when the scan data in and scan data out have been compressed. A method for debugging scan chains includes selecting a scan chain for debugging using a scan chain selection block and then providing scan test vectors to the selected scan chain. The scan test vectors undergo various scan test stages to generate scan response vectors. The scan response vectors are compared with ideal response vectors to identify a failing scan chain.