Patents by Inventor Saurabh Tiwary

Saurabh Tiwary has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Methods and systems for high sigma yield estimation
    Patent number: 8219355
    Abstract: For an integrated circuit associated with a plurality of parameters whose values are described by a first probability distribution function, a method for estimating a failure probability includes selecting a first plurality of samples, performing a first test to determine an outcome for each of the first plurality of samples and identifying failed samples, and clustering the failed samples using a computer-implemented cluster forming method that, in some cases, returns multiple clusters. The method also includes forming a probability distribution function for each of the clusters, forming a composite probability distribution function that includes a weighted combination of the first probability distribution function and the probability distribution function for each of the clusters. The method further includes selecting a second plurality of samples using the composite probability distribution function and performing a second test to determine an outcome for each of the second plurality of samples.
    Type: Grant
    Filed: December 23, 2009
    Date of Patent: July 10, 2012
    Assignee: Cadence Design Systems, Inc.
    Inventors: Saurabh Tiwary, Hongzhou Liu, Hui Zhang
  • Methods and systems for high sigma yield estimation using reduced dimensionality
    Patent number: 8195427
    Abstract: For an integrated circuit associated with a first plurality of parameters whose values are described by a first probability distribution function, a method for estimating a failure probability includes selecting a first plurality of samples, performing a first test to determine an outcome for each of the first plurality of samples and identifying failed samples. A second plurality of parameters is selected that has fewer parameters than the first plurality of parameters. The failed samples are clustered in the space of the second plurality of parameters using a computer-implemented cluster forming method that, in some cases, returns multiple clusters. The method also includes forming a probability distribution function for each of the clusters, forming a composite probability distribution function that includes a weighted combination of the first probability distribution function and the probability distribution function for each of the clusters.
    Type: Grant
    Filed: December 23, 2009
    Date of Patent: June 5, 2012
    Assignee: Cadence Design Systems, Inc.
    Inventors: Saurabh Tiwary, Hongzhou Liu, Hui Zhang
  • METHODS AND SYSTEMS FOR HIGH SIGMA YIELD ESTIMATION
    Publication number: 20110153271
    Abstract: For an integrated circuit associated with a plurality of parameters whose values are described by a first probability distribution function, a method for estimating a failure probability includes selecting a first plurality of samples, performing a first test to determine an outcome for each of the first plurality of samples and identifying failed samples, and clustering the failed samples using a computer-implemented cluster forming method that, in some cases, returns multiple clusters. The method also includes forming a probability distribution function for each of the clusters, forming a composite probability distribution function that includes a weighted combination of the first probability distribution function and the probability distribution function for each of the clusters. The method further includes selecting a second plurality of samples using the composite probability distribution function and performing a second test to determine an outcome for each of the second plurality of samples.
    Type: Application
    Filed: December 23, 2009
    Publication date: June 23, 2011
    Applicant: Cadence Design Systems, Inc.
    Inventors: Saurabh Tiwary, Hongzhou Liu, Hui Zhang
  • METHODS AND SYSTEMS FOR HIGH SIGMA YIELD ESTIMATION USING REDUCED DIMENSIONALITY
    Publication number: 20110153272
    Abstract: For an integrated circuit associated with a first plurality of parameters whose values are described by a first probability distribution function, a method for estimating a failure probability includes selecting a first plurality of samples, performing a first test to determine an outcome for each of the first plurality of samples and identifying failed samples. A second plurality of parameters is selected that has fewer parameters than the first plurality of parameters. The failed samples are clustered in the space of the second plurality of parameters using a computer-implemented cluster forming method that, in some cases, returns multiple clusters. The method also includes forming a probability distribution function for each of the clusters, forming a composite probability distribution function that includes a weighted combination of the first probability distribution function and the probability distribution function for each of the clusters.
    Type: Application
    Filed: December 23, 2009
    Publication date: June 23, 2011
    Applicant: Cadence Design Systems, Inc.
    Inventors: Saurabh Tiwary, Hongzhou Liu, Hui Zhang