Patents by Inventor Saurabh Upadhyay

Saurabh Upadhyay has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11762017
    Abstract: A system for performing a scan test of a processor core includes a scan test module and a processor including a processor core and an input/output die, where the input/output die is coupled to the processor core. The scan test module transmits, in parallel to the input/output die, scan test input data. A serializer/deserializer module of the input/output die receives the input data, serializes the input data, and transmits the serialized input data to the processor core. A serializer/deserializer module of the processor core receives the serialized scan test input data, deserializes the input data, receives result data generated in dependence upon the input data, serializes the result data, and transmits the serialized result data to the input/output die. The input/output die serializer/deserializer module receives the result data, deserializes the result data, and provides the result data to the scan test module. Error detection can be carried out through redundancy.
    Type: Grant
    Filed: November 22, 2021
    Date of Patent: September 19, 2023
    Assignee: ADVANCED MICRO DEVICES, INC.
    Inventors: Ahmet Tokuz, Saurabh Upadhyay
  • Patent number: 11739057
    Abstract: The present invention relates to the polymorphic forms of Belinostat. The invention also relates to the process for the preparation of the polymorphic forms of Belinostat. This invention further relates to pharmaceutical composition of said polymorphic forms of Belinostat and use thereof in the treatment of a patient in need thereof.
    Type: Grant
    Filed: June 3, 2021
    Date of Patent: August 29, 2023
    Assignee: FRESENIUS KABI ONCOLOGY LTD.
    Inventors: Sridhar Reddy Male, Saurabh Upadhyay, Suneel Kumar Sharma, Hrishikesh Acharya, Govind Singh, Saswata Lahiri, Walter Cabri
  • Publication number: 20220082623
    Abstract: A system for performing a scan test of a processor core includes a scan test module and a processor including a processor core and an input/output die, where the input/output die is coupled to the processor core. The scan test module transmits, in parallel to the input/output die, scan test input data. A serializer/deserializer module of the input/output die receives the input data, serializes the input data, and transmits the serialized input data to the processor core. A serializer/deserializer module of the processor core receives the serialized scan test input data, deserializes the input data, receives result data generated in dependence upon the input data, serializes the result data, and transmits the serialized result data to the input/output die. The input/output die serializer/deserializer module receives the result data, deserializes the result data, and provides the result data to the scan test module. Error detection can be carried out through redundancy.
    Type: Application
    Filed: November 22, 2021
    Publication date: March 17, 2022
    Inventors: AHMET TOKUZ, SAURABH UPADHYAY
  • Patent number: 11181579
    Abstract: A system for performing a scan test of a processor core includes a scan test module and a processor including a processor core and an input/output die, where the input/output die is coupled to the processor core. The scan test module transmits, in parallel to the input/output die, scan test input data. A serializer/deserializer module of the input/output die receives the input data, serializes the input data, and transmits the serialized input data to the processor core. A serializer/deserializer module of the processor core receives the serialized scan test input data, deserializes the input data, receives result data generated in dependence upon the input data, serializes the result data, and transmits the serialized result data to the input/output die. The input/output die serializer/deserializer module receives the result data, deserializes the result data, and provides the result data to the scan test module. Error detection can be carried out through redundancy.
    Type: Grant
    Filed: October 21, 2019
    Date of Patent: November 23, 2021
    Assignee: ADVANCED MICRO DEVICES, INC.
    Inventors: Ahmet Tokuz, Saurabh Upadhyay
  • Publication number: 20210292276
    Abstract: The present invention relates to the polymorphic forms of Belinostat. The invention also relates to the process for the preparation of the polymorphic forms of Belinostat. This invention further relates to pharmaceutical composition of said polymorphic forms of Belinostat and use thereof in the treatment of a patient in need thereof.
    Type: Application
    Filed: June 3, 2021
    Publication date: September 23, 2021
    Applicant: FRESENIUS KABI ONCOLOGY LTD.
    Inventors: Sridhar Reddy MALE, Saurabh UPADHYAY, Suneel Kumar SHARMA, Hrishikesh ACHARYA, Govind SINGH, Saswata LAHIRI, Walter CABRI
  • Patent number: 11059777
    Abstract: The present invention relates to the polymorphic forms of Belinostat. The invention also relates to the process for the preparation of the polymorphic forms of Belinostat. This invention further relates to pharmaceutical composition of said polymorphic forms of Belinostat and use thereof in the treatment of a patient in need thereof.
    Type: Grant
    Filed: July 25, 2017
    Date of Patent: July 13, 2021
    Assignee: Fresenius Kabi Oncology Ltd.
    Inventors: Sridhar Reddy Male, Saurabh Upadhyay, Suneel Kumar Sharma, Hrishikesh Acharya, Govind Singh, Saswata Lahiri, Walter Cabri
  • Publication number: 20210116503
    Abstract: A system for performing a scan test of a processor core includes a scan test module and a processor including a processor core and an input/output die, where the input/output die is coupled to the processor core. The scan test module transmits, in parallel to the input/output die, scan test input data. A serializer/deserializer module of the input/output die receives the input data, serializes the input data, and transmits the serialized input data to the processor core. A serializer/deserializer module of the processor core receives the serialized scan test input data, deserializes the input data, receives result data generated in dependence upon the input data, serializes the result data, and transmits the serialized result data to the input/output die. The input/output die serializer/deserializer module receives the result data, deserializes the result data, and provides the result data to the scan test module. Error detection can be carried out through redundancy.
    Type: Application
    Filed: October 21, 2019
    Publication date: April 22, 2021
    Inventors: AHMET TOKUZ, SAURABH UPADHYAY
  • Publication number: 20190241511
    Abstract: The present invention relates to the polymorphic forms of Belinostat. The invention also relates to the process for the preparation of the polymorphic forms of Belinostat. This invention further relates to pharmaceutical composition of said polymorphic forms of Belinostat and use thereof in the treatment of a patient in need thereof.
    Type: Application
    Filed: July 25, 2017
    Publication date: August 8, 2019
    Applicant: FRESENIUS KABI ONCOLOGY LTD.
    Inventors: Sridhar Reddy MALE, Saurabh UPADHYAY, Suneel Kumar SHARMA, Hrishikesh ACHARYA, Govind SINGH, Saswata LAHIRI, Walter CABRI
  • Patent number: 8806093
    Abstract: To address the need for efficient and reliable testing of integrated devices, system on chips, and computers, deterministic behavior for an interface is accomplished by fixing variation in latency associated with receiver and transmitter data stream. The interface may be a serial interface that is PCIe compliant and corrects latency variations in the receiver that consequently results in deterministic transmit data. Consequently, the data received and/or transmitted is predictable with respect to time and facilitates testing and validation of the devices and logic associated with the interface.
    Type: Grant
    Filed: April 1, 2010
    Date of Patent: August 12, 2014
    Assignee: Intel Corporation
    Inventors: Bibbin Chacko, Guadalupe J. Garcia, Saurabh Upadhyay
  • Publication number: 20110243211
    Abstract: To address the need for efficient and reliable testing of integrated devices, system on chips, and computers, deterministic behavior for an interface is accomplished by fixing variation in latency associated with receiver and transmitter data stream. The interface may be a serial interface that is PCIe compliant and corrects latency variations in the receiver that consequently results in deterministic transmit data. Consequently, the data received and/or transmitted is predictable with respect to time and facilitates testing and validation of the devices and logic associated with the interface.
    Type: Application
    Filed: April 1, 2010
    Publication date: October 6, 2011
    Inventors: Bibbing Chacko, Guadalupe J. Garcia, Saurabh Upadhyay