Abstract: A method of provisioning an integrated circuit with decoupling capacitance includes identifying in an initial design of the integrated circuit lacking decoupling elements, a standard cell instance satisfying a transient power or frequency switching criteria. Based on a transient power characteristic of the standard cell instance, a decoupling capacitance requirement for the standard cell instance is determined. The decoupling capacitance requirement indicates a capacitance sufficient to bring the standard cell instance into compliance with a stability constraint on a supply voltage node of the standard cell instance. A decoupling capacitor satisfying the decoupling capacitance requirement is provisioned by appending an appropriate sized decap transistor having one or more gate electrode elements to the standard cell instance.

Abstract: A CMOS cell incorporated on an integrated circuit including a PMOS transistor and an NMOS transistor. The current terminals of the PMOS and NMOS transistors are coupled in series between a lower voltage supply rail and a reference rail. The well connection of the PMOS transistor is coupled to an upper voltage supply rail having a voltage level greater than the lower voltage supply rail. The CMOS cell has low voltage swing and low leakage current to reduce power consumption. A second PMOS and NMOS transistor pair may be included and coupled in similar manner and to the first PMOS and NMOS pair to form a non-inverting cell. The PMOS transistors may be implemented in an N-well that is conductively tied to the upper supply voltage rail to avoid isolation barriers. The cell may be used in a clock tree to significantly reduce power consumption of the integrated circuit.

Abstract: An approach is provided in which a design tool executes static timing analysis of an integrated circuit design using a first set of timing values corresponding to a first set of layout properties of a transistor included in a standard cell utilized by the integrated circuit design. When the design tool determines that the static timing analysis generates a timing violation within a violation budget, the design tool selects a second set of timing values of the standard cell corresponding to a second set of layout properties of the transistor. The design tool determines that re-execution of the static timing analysis using the second set of timing values resolves the timing violation and, in turn, generates mask layer data that includes the second set of layout properties.

Abstract: An approach is provided in which a design tool executes static timing analysis of an integrated circuit design using a first set of timing values corresponding to a first set of layout properties of a transistor included in a standard cell utilized by the integrated circuit design. When the design tool determines that the static timing analysis generates a timing violation within a violation budget, the design tool selects a second set of timing values of the standard cell corresponding to a second set of layout properties of the transistor. The design tool determines that re-execution of the static timing analysis using the second set of timing values resolves the timing violation and, in turn, generates mask layer data that includes the second set of layout properties.

Abstract: A CMOS cell incorporated on an integrated circuit including a PMOS transistor and an NMOS transistor. The current terminals of the PMOS and NMOS transistors are coupled in series between a lower voltage supply rail and a reference rail. The well connection of the PMOS transistor is coupled to an upper voltage supply rail having a voltage level greater than the lower voltage supply rail. The CMOS cell has low voltage swing and low leakage current to reduce power consumption. A second PMOS and NMOS transistor pair may be included and coupled in similar manner and to the first PMOS and NMOS pair to form a non-inverting cell. The PMOS transistors may be implemented in an N-well that is conductively tied to the upper supply voltage rail to avoid isolation barriers. The cell may be used in a clock tree to significantly reduce power consumption of the integrated circuit.

Abstract: A method of provisioning an integrated circuit with decoupling capacitance includes identifying in an initial design of the integrated circuit lacking decoupling elements, a standard cell instance satisfying a transient power or frequency switching criteria. Based on a transient power characteristic of the standard cell instance, a decoupling capacitance requirement for the standard cell instance is determined. The decoupling capacitance requirement indicates a capacitance sufficient to bring the standard cell instance into compliance with a stability constraint on a supply voltage node of the standard cell instance. A decoupling capacitor satisfying the decoupling capacitance requirement is provisioned by appending an appropriate sized decap transistor having one or more gate electrode elements to the standard cell instance.

Abstract: An approach is provided in which a system executes transistor-level circuit simulation of a standard cell that includes parameters corresponding to a semiconductor manufacturing technology process. Sensitivity data is collected that quantifies changes to performance metrics corresponding to the standard cell in response to adjusting one or more of the parameters during the transistor-level circuit simulation. In turn, the system generates derate factors based upon the sensitivity data and tests an integrated circuit design according to the derate factors. Testing the integrated circuit design includes performing static timing analysis on the integrated circuit design that simulates operation of a device built from the integrated circuit design using the semiconductor technology process. In one embodiment, when the static timing analysis indicates timing violations, the system dynamically generates custom derate factors for particular cell instances corresponding to the timing violations.

Abstract: An integrated circuit includes a first plurality of transistors and a second plurality of transistors coupled together to form a standard cell that performs a logic function. Each of the first plurality of transistors is more critical to a speed of operation of the standard cell than any of the transistors of the second plurality of transistors. Each of the first plurality of transistors has a gate length longer than a gate length of any of the transistors of the second plurality of transistors.

Abstract: Embodiments of systems and methods for leakage reduction of a cell are presented herein. According to one embodiment, a path module can identify each rail-to-rail path in a cell. In the embodiment, a transistor set module can select one or more transistors that are coupled to a rail of the cell and, if removed, no rail-to-rail path would exist in the cell. A layout modification module can transform the cell by upsizing a gate length of each transistor of the selected transistors to create a low-leakage version of the cell.

Abstract: An integrated circuit includes a first plurality of transistors and a second plurality of transistors coupled together to form a standard cell that performs a logic function. Each of the first plurality of transistors is more critical to a speed of operation of the standard cell than any of the transistors of the second plurality of transistors. Each of the first plurality of transistors has a gate length longer than a gate length of any of the transistors of the second plurality of transistors.

Abstract: A semiconductor power network decoupling capacitance (decap) budgeting problem is formulated to minimize the total decap to be added to the network subject to voltage constraints on the network nodes of a semiconductor circuit design. Voltage constraints on the decap to be added are taken into consideration such that the decap can be distributed throughout a hot spot region of the semiconductor circuit design and not be limited to placement at a single location in the circuit. Dynamic network voltages are at all times maintained greater than a user-specified threshold voltage level.

Abstract: A semiconductor power network decoupling capacitance (decap) budgeting problem is formulated to minimize the total decap to be added to the network subject to voltage constraints on the network nodes of a semiconductor circuit design. Voltage constraints on the decap to be added are taken into consideration such that the decap can be distributed throughout a hot spot region of the semiconductor circuit design and not be limited to placement at a single location in the circuit. Dynamic network voltages are at all times maintained greater than a user-specified threshold voltage level.