Abstract: A processing device included in a protocol evaluation support apparatus executes creation processing (S302 and S303) for creating a simultaneous merging symbol at a portion in a protocol where a plurality of elements simultaneously merge into one element, and creating a simultaneous branching symbol at a portion in a protocol where one element simultaneously branches to a plurality of elements, development processing (S304) for developing the protocol for each of paths included in the process procedure, removal processing (S305 and S306) for removing all of the elements that are duplicated in a process after the simultaneous merging symbol and removing all of the elements that are duplicated in a process before the simultaneous branching symbol for the protocol, and calculation processing for making each of individual evaluation values correspond to each of the remaining elements and calculating an overall evaluation value of the protocol based on the individual evaluation values made to correspond to the rem

Abstract: A business information management server 1 includes: a performance data collection unit that collects performance data of each business process from a data generation device 4 for each business flow, and stores the collected performance data in a storage device in association with a business in the business process and related elements related to the business; and a performance data search unit that, when a business flow and a search condition regarding similarity of performance data are designated together with a reference business flow, extracts a business flow similar to the reference business flow from among a plurality of business flows associated with the performance data stored in the storage device on the basis of the search condition, extracts performance data similar to performance data of the reference business flow from among the performance data of the extracted business flow, and outputs an extraction result.

Abstract: The purpose of the present invention is to provide an inspection device that can determine the reliability of an image feature value in a target region of an observation image of a sample. This inspection device extracts a first feature value from a target region including an inspection target in an observation image of a sample, extracts a second feature value from a reference region other than the target region in the observation image, and compares the first feature value and the second feature value, thereby calculating the reliability of the first feature value (see FIG. 1).

Abstract: A spectral analysis unit receives items of spectral data acquired by a measurement device with regards to a material according to a prescribed measurement condition, and calculates spectral feature amounts of the spectral data using a model function.

Abstract: Even in a case of a waste plastic whose use history is unknown, blending of an additive for recycling into a recycled plastic having a desired physical property can be estimated with high accuracy. A plastic recycling supporting apparatus 100 that supports plastic recycling in which a plastic is blended with an additive and is recycled into a recycled plastic having a desired physical property includes: a physical property and deterioration estimator 140 configured to estimate, using a physical property and deterioration estimation model, a physical property and a deterioration degree of the plastic based on a texture structural feature extracted from surface analysis data of the plastic; and a blending estimator 150 configured to estimate a physical property of the recycled plastic based on the physical property and the deterioration degree of the plastic and a blending condition of the additive using a physical property recovery model.

Abstract: Provided is a microstructure evaluation system capable of detecting, based on an image of a sample, a fluctuation caused by an imaging device. A microstructure evaluation device 10 includes: a feature data extraction unit 13 configured to extract first feature data from an image captured by an imaging device 1 while changing an observation field of view on a sample 4; and a fluctuation evaluation unit 14 configured to calculate a long-term fluctuation of the first feature data, return an observation field of view to a position before occurrence of the long-term fluctuation and re-capture to acquire a re-captured image when the long-term fluctuation exceeds a predetermined criterion, and calculate a difference between the first feature data of the captured image at the position before the occurrence of the long-term fluctuation and the first feature data of the re-captured image.

Abstract: This invention makes it possible to build an image identification model having high accuracy of identification using divided training images into which training images are divided.

Abstract: A measurement system comprising: a measurement apparatus observing a sample based on an observation condition including parameters; and an observation condition database storing data in which a search key related to the sample and the observation condition, a control unit calculating information on an observation condition of a sample is configured to: receive an observation condition search request including a search key related to a target sample; refer the observation condition database to search for the first data matching or similar to the search key related to the target sample included in the observation condition search request, calculate, based on the searched first data, a candidate observation condition of the measurement apparatus for observing the target sample, and output display data for presenting the candidate observation condition.

Abstract: An information processing system creates a teacher database configured to train an analysis model from an observation image and labeling information corresponding to the observation image using an information processor. This system includes a storage unit, an image processing unit, and a teacher database creating unit. The storage unit stores image processing data formed of information showing a relationship between an observation condition and a parameter relating to the observation image. Further stores a first observation image, a first observation condition, and first labeling information. The image processing unit accepts the first observation image and the first observation condition as inputs, performs image processing corresponding to the parameter to the first observation image based on the image processing data, and creates a second observation image corresponding to a second observation condition.

Abstract: A measurement system comprising: a measurement apparatus observing a sample based on an observation condition including parameters; and an observation condition database storing data in which a search key related to the sample and the observation condition, a control unit calculating information on an observation condition of a sample is configured to: receive an observation condition search request including a search key related to a target sample; refer the observation condition database to search for the first data matching or similar to the search key related to the target sample included in the observation condition search request, calculate, based on the searched first data, a candidate observation condition of the measurement apparatus for observing the target sample, and output display data for presenting the candidate observation condition.

Abstract: The present invention aims to provide a blood flow analysis device capable of accurately identifying a change in the blood flow in a muscle caused by resistance exercise performed by a subject. A blood flow analysis device according to the present invention specifies a resistance exercise period during which a muscle of a subject present at a position to be measured by a motion sensor is performing a resistance exercise, and analyzes a light detection signal in the resistance exercise period, to thereby calculate a feature amount of a change in the blood flow in the muscle of the subject in the resistance exercise period (see FIG. 1).

Abstract: Image analysis using machine learning technology utilizes a texture structure which is analyzed while a manufacturing process is changed for a purpose of searching for an optimum condition or the like. One aspect is an information processing system including: an identifier configured to output an identification result with an image as input; an automatically identifiable range storage unit configured to store an identifiable range of the identifier defined by numerical values in n (n is an integer of 1 or more) dimensions; an acquisition unit configured to acquire the numerical values corresponding to the image; a control unit configured to compare the numerical values acquired by the acquisition unit and the identifiable range; and an alert output unit configured to output an alert when the control unit determines that the numerical values acquired by the acquisition unit deviate from the identifiable range.

Abstract: An information processing system creates a teacher database configured to train an analysis model from an observation image and labeling information corresponding to the observation image using an information processor. This system includes a storage unit, an image processing unit, and a teacher database creating unit. The storage unit stores image processing data formed of information showing a relationship between an observation condition and a parameter relating to the observation image. Further stores a first observation image, a first observation condition, and first labeling information. The image processing unit accepts the first observation image and the first observation condition as inputs, performs image processing corresponding to the parameter to the first observation image based on the image processing data, and creates a second observation image corresponding to a second observation condition.

Abstract: In this invention, information of material composition, process conditions and candidates of crystal structure either known or imported from material database is used to determine sample stage tilt angle and working distance (WD). Under these determined tilt angle and WD, the intensity of the electrons emitted at different angles and with different energies is measured using a scanning electron microscope (SEM) system comprising: a use of materials database containing materials composition, formation process, crystal structure and its electron yield; a sample stage that is able to move, rotate and tilt; an processing section for calculating optimum working distance for an observation from material database and measurement condition; means for acquiring an image of crystal information of a desired area of a sample based on an image obtained from SEM observation.

Abstract: In this invention, information of material composition, process conditions and candidates of crystal structure either known or imported from material database is used to determine sample stage tilt angle and working distance (WD). Under these determined tilt angle and WD, the intensity of the electrons emitted at different angles and with different energies is measured using a scanning electron microscope (SEM) system comprising: a use of materials database containing materials composition, formation process, crystal structure and its electron yield; a sample stage that is able to move, rotate and tilt; an processing section for calculating optimum working distance for an observation from material database and measurement condition; means for acquiring an image of crystal information of a desired area of a sample based on an image obtained from SEM observation.