Patents by Inventor Schuyler Eldridge
Schuyler Eldridge has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20260087214Abstract: The present application relates to generating a design for an integrated circuit, where the design includes a layer that can be enabled and/or disabled on demand. In an example, a system receives an input declaring a layer associated with a function. The system defines a first layer block of the layer, where corresponding code references the layer and is included in code of a first module. The system defines a second layer block of the layer, where corresponding code references the layer and is included in code of a second module. The system defines a first port for the first layer block, the first port referencing the layer and indicating that output of the first layer block is accessible to the second layer block conditioned on the layer being enabled. The system causes a compilation of the codes, where the compilation removes the first port from the circuit design.Type: ApplicationFiled: September 24, 2024Publication date: March 26, 2026Applicant: SiFive, Inc.Inventor: Schuyler Eldridge
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Publication number: 20230385496Abstract: Embodiments are provided for providing enhanced protection of an integrated circuit in a computing system by a processor. A logic locking FSM component or a logic locking with RTL gating may be applied to a current design logic to enable and protect operations of an integrated circuit, where the current design logic remains unchanged. The operation of the integrated circuit may be activated based upon providing to the integrated circuit a correct key from the logic locking FSM component or the logic locking with RTL gating.Type: ApplicationFiled: May 24, 2022Publication date: November 30, 2023Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATIONInventors: Jinwook JUNG, Jennifer KAZDA, Schuyler ELDRIDGE, Peilin SONG, Gi-Joon NAM
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Patent number: 11810340Abstract: A system includes a determination component that determines output for successively larger neural networks of a set; and a consensus component that determines consensus between a first neural network and a second neural network of the set. A linear chain of increasingly complex neural networks trained on progressively larger inputs is utilized (e.g., increasingly complex neural networks is generally representative of increased accuracy). Outputs of progressively networks are computed until a consensus point is reached—where two or more successive large networks yield a same inference output. At such point of consensus the larger neural network of the set reaching consensus can be deemed appropriately sized (or of sufficient complexity) for a classification task at hand.Type: GrantFiled: November 29, 2017Date of Patent: November 7, 2023Assignee: International Business Machines CorporationInventors: Pradip Bose, Alper Buyuktosunoglu, Schuyler Eldridge, Karthik V. Swaminathan, Swagath Venkataramani
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Patent number: 11630152Abstract: Techniques facilitating determination and correction of physical circuit event related errors of a hardware design are provided. A system can comprise a memory that stores computer executable components and a processor that executes computer executable components stored in the memory. The computer executable components can comprise a simulation component that injects a fault into a latch and a combination of logic of an emulated hardware design. The fault can be a biased fault injection that can mimic an error caused by a physical circuit event error vulnerability. The computer executable components can also comprise an observation component that determines one or more paths of the emulated hardware design that are vulnerable to physical circuit event related errors based on the biased fault injection.Type: GrantFiled: March 4, 2021Date of Patent: April 18, 2023Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATIONInventors: Pradip Bose, Alper Buyuktosunoglu, Schuyler Eldridge, Karthik V. Swaminathan, Yazhou Zu
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Patent number: 11599795Abstract: An N modular redundancy method, system, and computer program product include a computer-implemented N modular redundancy method for neural networks, the method including selectively replicating the neural network by employing one of checker neural networks and selective N modular redundancy (N-MR) applied only to critical computations.Type: GrantFiled: November 8, 2017Date of Patent: March 7, 2023Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATIONInventors: Pradip Bose, Alper Buyuktosunoglu, Schuyler Eldridge, Karthik V Swaminathan, Augusto Vega, Swagath Venkataramani
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Publication number: 20210270897Abstract: Techniques facilitating determination and correction of physical circuit event related errors of a hardware design are provided. A system can comprise a memory that stores computer executable components and a processor that executes computer executable components stored in the memory. The computer executable components can comprise a simulation component that injects a fault into a latch and a combination of logic of an emulated hardware design. The fault can be a biased fault injection that can mimic an error caused by a physical circuit event error vulnerability. The computer executable components can also comprise an observation component that determines one or more paths of the emulated hardware design that are vulnerable to physical circuit event related errors based on the biased fault injection.Type: ApplicationFiled: March 4, 2021Publication date: September 2, 2021Inventors: Pradip Bose, Alper Buyuktosunoglu, Schuyler Eldridge, Karthik V. Swaminathan, Yazhou Zu
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Patent number: 11037650Abstract: A first voltage may be applied to a memory in a neural network. The memory may include one or more memory cells. A processor may determine that a first memory cell in the memory is faulty at the first voltage. The first voltage may be a low voltage. The processor may identify a first factor in the neural network. The first factor may have a low criticality in the neural network. The processor may determine to store the first factor in the first memory cell. The processor may store the first factor in the first memory cell.Type: GrantFiled: January 28, 2020Date of Patent: June 15, 2021Assignee: International Business Machines CorporationInventors: Alper Buyuktosunoglu, Swagath Venkataramani, Rajiv Joshi, Karthik V. Swaminathan, Schuyler Eldridge, Pradip Bose
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Low-overhead error prediction and preemption in deep neural network using apriori network statistics
Patent number: 11016840Abstract: A coarse error correction system for detecting, predicting, and correcting errors in neural networks is provided. The coarse error correction system receives a first set of statistics that are computed from values collected from a neural network during a training phase of the neural network. The coarse error correction system computes a second set of statistics based on values collected from the neural network during a run-time phase of the neural network. The coarse error correction system detects an error in the neural network during the run-time phase of the neural network by comparing the first set of statistics with the second set of statistics. The coarse error correction system increases a voltage setting to the neural network based on the detected error.Type: GrantFiled: January 30, 2019Date of Patent: May 25, 2021Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATIONInventors: Swagath Venkataramani, Schuyler Eldridge, Karthik V. Swaminathan, Alper Buyuktosunoglu, Pradip Bose -
Patent number: 11002791Abstract: Techniques facilitating determination and correction of physical circuit event related errors of a hardware design are provided. A system can comprise a memory that stores computer executable components and a processor that executes computer executable components stored in the memory. The computer executable components can comprise a simulation component that injects a fault into a latch and a combination of logic of an emulated hardware design. The fault can be a biased fault injection that can mimic an error caused by a physical circuit event error vulnerability. The computer executable components can also comprise an observation component that determines one or more paths of the emulated hardware design that are vulnerable to physical circuit event related errors based on the biased fault injection.Type: GrantFiled: May 14, 2020Date of Patent: May 11, 2021Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATIONInventors: Pradip Bose, Alper Buyuktosunoglu, Schuyler Eldridge, Karthik V. Swaminathan, Yazhou Zu
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Publication number: 20200300913Abstract: Techniques facilitating determination and correction of physical circuit event related errors of a hardware design are provided. A system can comprise a memory that stores computer executable components and a processor that executes computer executable components stored in the memory. The computer executable components can comprise a simulation component that injects a fault into a latch and a combination of logic of an emulated hardware design. The fault can be a biased fault injection that can mimic an error caused by a physical circuit event error vulnerability. The computer executable components can also comprise an observation component that determines one or more paths of the emulated hardware design that are vulnerable to physical circuit event related errors based on the biased fault injection.Type: ApplicationFiled: May 14, 2020Publication date: September 24, 2020Inventors: Pradip Bose, Alper Buyuktosunoglu, Schuyler Eldridge, Karthik V. Swaminathan, Yazhou Zu
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LOW-OVERHEAD ERROR PREDICTION AND PREEMPTION IN DEEP NEURAL NETWORK USING APRIORI NETWORK STATISTICS
Publication number: 20200241954Abstract: A coarse error correction system for detecting, predicting, and correcting errors in neural networks is provided. The coarse error correction system receives a first set of statistics that are computed from values collected from a neural network during a training phase of the neural network. The coarse error correction system computes a second set of statistics based on values collected from the neural network during a run-time phase of the neural network. The coarse error correction system detects an error in the neural network during the run-time phase of the neural network by comparing the first set of statistics with the second set of statistics. The coarse error correction system increases a voltage setting to the neural network based on the detected error.Type: ApplicationFiled: January 30, 2019Publication date: July 30, 2020Inventors: Swagath Venkataramani, Schuyler Eldridge, Karthik V. Swaminathan, Alper Buyuktosunoglu, Pradip Bose -
Patent number: 10690723Abstract: Techniques facilitating determination and correction of physical circuit event related errors of a hardware design are provided. A system can comprise a memory that stores computer executable components and a processor that executes computer executable components stored in the memory. The computer executable components can comprise a simulation component that injects a fault into a latch and a combination of logic of an emulated hardware design. The fault can be a biased fault injection that can mimic an error caused by a physical circuit event error vulnerability. The computer executable components can also comprise an observation component that determines one or more paths of the emulated hardware design that are vulnerable to physical circuit event related errors based on the biased fault injection.Type: GrantFiled: April 30, 2019Date of Patent: June 23, 2020Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATIONInventors: Pradip Bose, Alper Buyuktosunoglu, Schuyler Eldridge, Karthik V. Swaminathan, Yazhou Zu
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Publication number: 20200168290Abstract: A first voltage may be applied to a memory in a neural network. The memory may include one or more memory cells. A processor may determine that a first memory cell in the memory is faulty at the first voltage. The first voltage may be a low voltage. The processor may identify a first factor in the neural network. The first factor may have a low criticality in the neural network. The processor may determine to store the first factor in the first memory cell. The processor may store the first factor in the first memory cell.Type: ApplicationFiled: January 28, 2020Publication date: May 28, 2020Inventors: Alper Buyuktosunoglu, Swagath Venkataramani, Rajiv Joshi, Karthik V. Swaminathan, Schuyler Eldridge, Pradip Bose
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Publication number: 20200158782Abstract: Techniques facilitating determination and correction of physical circuit event related errors of a hardware design are provided. A system can comprise a memory that stores computer executable components and a processor that executes computer executable components stored in the memory. The computer executable components can comprise a simulation component that injects a fault into a latch and a combination of logic of an emulated hardware design. The fault can be a biased fault injection that can mimic an error caused by a physical circuit event error vulnerability. The computer executable components can also comprise an observation component that determines one or more paths of the emulated hardware design that are vulnerable to physical circuit event related errors based on the biased fault injection.Type: ApplicationFiled: April 30, 2019Publication date: May 21, 2020Inventors: Pradip Bose, Alper Buyuktosunoglu, Schuyler Eldridge, Karthik V. Swaminathan, Yazhou Zu
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Patent number: 10607715Abstract: A first voltage may be applied to a memory in a neural network. The memory may include one or more memory cells. A processor may determine that a first memory cell in the memory is faulty at the first voltage. The first voltage may be a low voltage. The processor may identify a first factor in the neural network. The first factor may have a low criticality in the neural network. The processor may determine to store the first factor in the first memory cell. The processor may store the first factor in the first memory cell.Type: GrantFiled: June 13, 2017Date of Patent: March 31, 2020Assignee: International Business Machines CorporationInventors: Alper Buyuktosunoglu, Swagath Venkataramani, Rajiv Joshi, Karthik V. Swaminathan, Schuyler Eldridge, Pradip Bose
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Patent number: 10365327Abstract: Techniques facilitating determination and correction of physical circuit event related errors of a hardware design are provided. A system can comprise a memory that stores computer executable components and a processor that executes computer executable components stored in the memory. The computer executable components can comprise a simulation component that injects a fault into a latch and a combination of logic of an emulated hardware design. The fault can be a biased fault injection that can mimic an error caused by a physical circuit event error vulnerability. The computer executable components can also comprise an observation component that determines one or more paths of the emulated hardware design that are vulnerable to physical circuit event related errors based on the biased fault injection.Type: GrantFiled: October 18, 2017Date of Patent: July 30, 2019Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATIONInventors: Pradip Bose, Alper Buyuktosunoglu, Schuyler Eldridge, Karthik V. Swaminathan, Yazhou Zu
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Publication number: 20190164048Abstract: A system includes a determination component that determines output for successively larger neural networks of a set; and a consensus component that determines consensus between a first neural network and a second neural network of the set. A linear chain of increasingly complex neural networks trained on progressively larger inputs is utilized (e.g., increasingly complex neural networks is generally representative of increased accuracy). Outputs of progressively networks are computed until a consensus point is reached—where two or more successive large networks yield a same inference output. At such point of consensus the larger neural network of the set reaching consensus can be deemed appropriately sized (or of sufficient complexity) for a classification task at hand.Type: ApplicationFiled: November 29, 2017Publication date: May 30, 2019Inventors: Pradip Bose, Alper Buyuktosunoglu, Schuyler Eldridge, Karthik V. Swaminathan, Swagath Venkataramani
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Publication number: 20190138903Abstract: An N modular redundancy method, system, and computer program product include a computer-implemented N modular redundancy method for neural networks, the method including selectively replicating the neural network by employing one of checker neural networks and selective N modular redundancy (N-MR) applied only to critical computations.Type: ApplicationFiled: November 8, 2017Publication date: May 9, 2019Inventors: Pradip Bose, Alper Buyuktosunoglu, Schuyler Eldridge, Karthik V Swaminathan, Augusto Vega, Swagath Venkataramani
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Publication number: 20190113572Abstract: Techniques facilitating determination and correction of physical circuit event related errors of a hardware design are provided. A system can comprise a memory that stores computer executable components and a processor that executes computer executable components stored in the memory. The computer executable components can comprise a simulation component that injects a fault into a latch and a combination of logic of an emulated hardware design. The fault can be a biased fault injection that can mimic an error caused by a physical circuit event error vulnerability. The computer executable components can also comprise an observation component that determines one or more paths of the emulated hardware design that are vulnerable to physical circuit event related errors based on the biased fault injection.Type: ApplicationFiled: October 18, 2017Publication date: April 18, 2019Inventors: Pradip Bose, Alper Buyuktosunoglu, Schuyler Eldridge, Karthik V. Swaminathan, Yazhou Zu
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Publication number: 20180358110Abstract: A first voltage may be applied to a memory in a neural network. The memory may include one or more memory cells. A processor may determine that a first memory cell in the memory is faulty at the first voltage. The first voltage may be a low voltage. The processor may identify a first factor in the neural network. The first factor may have a low criticality in the neural network. The processor may determine to store the first factor in the first memory cell. The processor may store the first factor in the first memory cell.Type: ApplicationFiled: June 13, 2017Publication date: December 13, 2018Inventors: Alper Buyuktosunoglu, Swagath Venkataramani, Rajiv Joshi, Karthik V. Swaminathan, Schuyler Eldridge, Pradip Bose