Patents by Inventor Scott A. Avent

Scott A. Avent has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Calibration measurements for network analyzers
    Patent number: 8928333
    Abstract: A method for measuring s-parameters of an N-port device under test (DUT), using an N-port test fixture and a network analyzer. The method includes: measuring calibration errors of the N-port test fixture using a reduced set of N/2 calibration standards; measuring calibration errors due to the network analyzer by calibrating only the network analyzer using analyzer-only calibration standards; isolating test fixture s-parameters errors using results of the analyzer-only calibration standards measurement and the N-port test fixture calibration standard measurement; measuring the s-parameters errors of the DUT; and correcting the s-parameters errors of the DUT corresponding to the isolated test fixture s-parameters errors and the calibration errors of the network analyzer.
    Type: Grant
    Filed: November 30, 2011
    Date of Patent: January 6, 2015
    Assignee: Raytheon Company
    Inventors: Darren E. Atkinson, Scott A. Avent
  • CALIBRATION MEASUREMENTS FOR NETWORK ANALYZERS
    Publication number: 20130134990
    Abstract: A method for measuring s-parameters of an N-port device under test (DUT), using an N-port test fixture and a network analyzer. The method includes: measuring calibration errors of the N-port test fixture using a reduced set of N/2 calibration standards; measuring calibration errors due to the network analyzer by calibrating only the network analyzer using analyzer-only calibration standards; isolating test fixture s-parameters errors using results of the analyzer-only calibration standards measurement and the N-port test fixture calibration standard measurement; measuring the s-parameters errors of the DUT; and correcting the s-parameters errors of the DUT corresponding to the isolated test fixture s-parameters errors and the calibration errors of the network analyzer.
    Type: Application
    Filed: November 30, 2011
    Publication date: May 30, 2013
    Applicant: RAYTHEON COMPANY
    Inventors: Darren E. Atkinson, Scott A. Avent