Abstract: A method for predicting the contribution of silicon interstitials to n-type dopant transient enhanced diffusion during a pn junction formation is disclosed. Initially, fundamental data for a set of microscopic processes that can occur during one or more material processing operations are obtained. The fundamental data are then utilized to build kinetic models for a set of reactions that contribute substantially to an evolution of n-type dopant concentration and electrical activities. The kinetic models are subsequently applied to a simulator to predict temporal and spatial evolutions of concentration and electrical activity profiles of the n-type dopants.

Abstract: A method for removing an oil seal and the like from a housing is disclosed, wherein the seal is of the type which is received in the housing for providing a sealed relation between the housing and a shaft which projects outwardly through the seal. The method is preferably carried out utilizing a tool which comprises a shank portion, and a working portion of generally S-shaped configuration which extends from the shank portion, the working portion comprising an upper portion and a lower portion which terminates in a tapered pry point. The tool is operable for removing a seal in accordance with the method by inserting the pry point between the seal and the shaft and then moving the tool so that the lower portion of the working portion rolls on the shaft to extract the seal. Thereafter, if necessary, the tool can be rolled further on the shaft until the upper portion engages the end of the shaft to provide additional leverage for extracting the seal.