Abstract: Calibrating the measurement of a distance between a transceiver and an object such as a radiating element (antenna) or a target by continuously changing the wavelength (frequency) of the transmitted wave and observing the rate of phase shift as a function of change in wavelength. The rate of phase shift change as a function of wavelength can be mathematically related to the total displacement to the reflecting object. This calibration technique is applicable to a sensing device comprising a transceiver configured to transmit a signal toward an object, detectors offset in phase to receive the transmitted signal and a reflected signal, and a processor configured with logic to measure a rate of phase shift proportional to the change in wavelength between the transmitted signal and the reflected signal at the detectors. The processor can be further configured with logic to relate the phase shift to displacement between the transceiver and the reflecting object.

Abstract: Calibrating the measurement of a distance between a transceiver and an object such as a radiating element (antenna) or a target by continuously changing the wavelength (frequency) of the transmitted wave and observing the rate of phase shift as a function of change in wavelength. The rate of phase shift change as a function of wavelength can be mathematically related to the total displacement to the reflecting object. This calibration technique is applicable to a sensing device comprising a transceiver configured to transmit a signal toward an object, detectors offset in phase to receive the transmitted signal and a reflected signal, and a processor configured with logic to measure a rate of phase shift proportional to the change in wavelength between the transmitted signal and the reflected signal at the detectors. The processor can be further configured with logic to relate the phase shift to displacement between the transceiver and the reflecting object.