Abstract: An interferometer for use in remote sensing systems includes a beam splitter that separates an input wave into a reflected wave, which travels along a first optical path within an upper interferometer arm, and a transmitted wave, which travels along a second optical path within a lower interferometer arm. The reflected and transmitted waves are subsequently recombined by the beam splitter for imaging onto a sensor. A highly dispersive element is incorporated into at least one of the pair of interferometer arms. Due to anomalous dispersion, a frequency shift in a wave transmitted through a dispersive element changes the optical path length within its corresponding arm. As a result, the recombined wave produces an interference pattern with a measurable phase change that can be utilized to calculate the original frequency shift in the input wave with great precision and potential sub-Hertz sensitivity.

Abstract: An interferometer for use in remote sensing systems includes a beam splitter that separates an input wave into a reflected wave, which travels along a first optical path within an upper interferometer arm, and a transmitted wave, which travels along a second optical path within a lower interferometer arm. The reflected and transmitted waves are subsequently recombined by the beam splitter for imaging onto a sensor. A highly dispersive element is incorporated into at least one of the pair of interferometer arms. Due to anomalous dispersion, a frequency shift in a wave transmitted through a dispersive element changes the optical path length within its corresponding arm. As a result, the recombined wave produces an interference pattern with a measurable phase change that can be utilized to calculate the original frequency shift in the input wave with great precision and potential sub-Hertz sensitivity.

Abstract: In a testing device, a method for implementing distributed pin mapping. The method includes receiving a request from a plurality of CPUs to access a pin map memory at each of a plurality of bridges, implementing accesses to the pin map memories locally at each of the plurality of bridges, and using pin map data from the accesses to the plurality of CPUs to enable access to testing device resources.

Abstract: In a testing device, a method for implementing distributed pin mapping. The method includes receiving a request from a plurality of CPUs to access a pin map memory at each of a plurality of bridges, implementing accesses to the pin map memories locally at each of the plurality of bridges, and using pin map data from the accesses to the plurality of CPUs to enable access to testing device resources.

Abstract: A vacuum cleaner having a base adapted to be moved on a surface to be cleaned, an inlet nozzle disposed on a lower surface of the base, a vacuum source, and a dirt receptacle. A lower handle is pivotally attached to the base at a lower pivot, and an upper handle is pivotally attached to the lower handle at an upper pivot. In one aspect, the vacuum cleaner includes an automatically-operated lower pivot lock that can restrict relative rotation between the lower handle and the base, and a manually-operated upper pivot lock that can restrict relative rotation between the upper handle and the lower handle. In another aspect, the vacuum cleaner includes a telescoping upper handle with electrical controls attached to the upper telescopic section of the upper handle. In still another aspect, the vacuum cleaner includes an exhaust vent located on an upwardly-facing surface of the base.

Abstract: Ablation of holes having diameters as small as 82 nm and having clean walls was obtained in a poly(methyl methacrylate) on a silicon substrate by focusing pulses from a Ne-like Ar, 46.9 nm wavelength, capillary-discharge laser using a freestanding Fresnel zone plate diffracting into third order is described. Spectroscopic analysis of light from the ablation has also been performed. These results demonstrate the use of focused coherent EUV/SXR light for the direct nanoscale patterning of materials.

Abstract: Ablation of holes having diameters as small as 82 nm and having clean walls was obtained in a poly(methyl methacrylate) on a silicon substrate by focusing pulses from a Ne-like Ar, 46.9 nm wavelength, capillary-discharge laser using a freestanding Fresnel zone plate diffracting into third order is described. Spectroscopic analysis of light from the ablation has also been performed. These results demonstrate the use of focused coherent EUV/SXR light for the direct nanoscale patterning of materials.

Abstract: Ablation of holes having diameters as small as 82 nm and having clean walls was obtained in a poly(methyl methacrylate) on a silicon substrate by focusing pulses from a Ne-like Ar, 46.9 nm wavelength, capillary-discharge laser using a freestanding Fresnel zone plate diffracting into third order is described. Spectroscopic analysis of light from the ablation has also been performed. These results demonstrate the use of focused coherent EUV/SXR light for the direct nanoscale patterning of materials.

Abstract: Abstract of the Disclosure Disclosed are radiation-resistant zone plates for use in laser-produced plasma (LPP) devices, and methods of manufacturing such zone plates. In one aspect, a method of manufacturing a zone plate provides for forming a masking layer over a supporting membrane, and creating openings through the masking layer in a diffractive grating pattern. Such a method also provides depositing radiation absorbent material in the openings in the masking layer and on the supporting membrane, and then stripping the remaining portions of the masking layer. Then, portions of the supporting membrane not covered by the absorbent material are removed, wherein the remaining portions of the supporting membrane covered by the absorbent material form separate grates. Also in such methods, cross-members are coupled to the grates for holding positions of the grates with respect to each other.

Abstract: Disclosed is a novel free space optical communication system comprising an optical amplifier configured to amplify an optical signal received from a fiber optic cable, a transmitter coupled to the optical amplifier and configured to transmit the amplified optical signal across a free space medium. The system also includes a receiver configured to receive the attenuated optical signal and a second optical amplifier coupled to the receiver configured to amplify the attenuated optical signal before transmitting the optical signal on to a fiber optic cable. The optical amplifier is preferably a Raman optical amplifier, but may also be any other optical amplifier, or combination of optical amplifiers, known in the art.

Abstract: A particle detection system uses a reflective optic comprising a curved surface to detect high angle scattered light generated by a particle in a liquid medium, when a laser beam is incident on the particle. When the particles transit the laser beam, light is scattered in all directions and is described by MIE scattering theory for particles about the size of the wavelength of light and larger or Rayleigh Scattering when the particles are smaller than the wavelength of light. By using the reflective optic, the scattered light can be detected over angles that are greater than normally obtainable.

Abstract: A nano-scale surface analysis system is configured to reduce a laser-produced plasma spot size, while maintaining flux levels at target. The system comprises a condenser zone plate operable to receive short wavelength radiation and focus the short wavelength radiation into a spot on the target. The target is positioned such it is located at an order of diffraction of the condenser zone plate that is greater than the first diffractive order of the condenser zone plate and sufficient to demagnify the spot to a diameter less than one micron. In addition, the target is still positioned such that a flux created at the target by the spot is sufficient to produce a nanoplasma.

Abstract: Systems and methods for use with an optical communication beam are disclosed. The system allows the beam of light to operate at an adequate power level that provides a robust optical link while minimizing any safety risk to humans. The system calibrates and controls the gain for an avalanche photodiode detector (APD). A detector circuit is used to calibrate the APD. Once calibrated, the detector circuit further provides an electrical bias to the APD to process or condition the electrical signal to produce a detector output. The systems and methods disclosed herein attenuate the power level of an incoming communication beam to prevent oversaturation of an APD. The system further provides an alignment signal, which is effective over a wide dynamic range of incoming power levels.

Abstract: A particle detection system uses a reflective optic comprising a curved surface to detect high angle scattered light generated by a particle in a liquid medium, when a laser beam is incident on the particle. When the particles transit the laser beam, light is scattered in all directions and is described by MIE scattering theory for particles about the size of the wavelength of light and larger or Rayleigh Scattering when the particles are smaller than the wavelength of light. By using the reflective optic, the scattered light can be detected over angles that are greater than normally obtainable.

Abstract: A particle detection system uses illumination incident at an angle to detect particles in a liquid such as water. By using illumination incident at an angle, the scattered light can be measured through a range of angles that are greater than the measured range of angles produced when the illumination is incident at a normal angle, when using the same detector. For example, the light can be measured through an angle that is twice that produced with illumination incident at a normal angle.

Abstract: A vacuum cleaner having a base adapted to be moved on a surface to be cleaned, an inlet nozzle disposed on a lower surface of the base, a vacuum source, and a dirt receptacle. A lower handle is pivotally attached to the base at a lower pivot, and an upper handle is pivotally attached to the lower handle at an upper pivot. In one aspect, the vacuum cleaner includes an automatically-operated lower pivot lock that can restrict relative rotation between the lower handle and the base, and a manually-operated upper pivot lock that can restrict relative rotation between the upper handle and the lower handle. In another aspect, the vacuum cleaner includes a telescoping upper handle with electrical controls attached to the upper telescopic section of the upper handle. In still another aspect, the vacuum cleaner includes an exhaust vent located on an upwardly-facing surface of the base.

Abstract: A nano-scale surface analysis system comprises an electrically powered apparatus for the generation of soft x-ray laser radiation. The apparatus comprises an excitation circuit having at least two or more electrically conducting structures separated by a liquid dielectric for providing a high current excitation pulse, and a capillary structure having a capillary with a length to diameter ration of about 20 to 1000 for enclosing a selected lasing material, wherein the excitation circuit is capable of generating a plasma volume within the capillary structure to produce a population inversion. The generator further comprises a focusing optic for receiving the soft x-ray radiation from the emissions source and focus the soft x-ray radiation onto a target for forming a nanoplasma, the soft x-ray radiation being focused onto an area of the target having a diameter of less than 100 nm.

Abstract: A laser produced plasma device comprises a shutter assembly for mitigating the contaminating effects of debris generated by the plasma. In one embodiment, the shutter assembly includes a rotatable shutter having at least one aperture that provides a line-of-sight between a radiation source and an exit of the device during a first period of rotation of the shutter, and obstructs the line-of-sight between the radiation source and the exit during a second period of rotation. The shutter assembly in this embodiment also includes a motor configured to rotate the shutter to permit passage of the X-rays through the at least one aperture during the first period of rotation, and to thereafter rotate the shutter to obstruct passage of the debris through the at least one aperture during the second period of rotation.

Abstract: Abstract of the Disclosure An improved short-wavelength microscope is described in which a specimen sample is placed between a condenser zone plate lens and an objective zone plate lens so that the specimen is aligned with a diffraction order of the condenser zone plate lens that is greater than one and proximal to the condenser zone plate.

Abstract: A system and method is disclosed for generation of a nanoplasma and/or nanofluorescence. The system includes an emissions source of soft x-rays. The emissions source can include a laser system as an energy source and target material that acts as a radiation source when illuminated by the laser system. The system further includes focusing optics particularly suited for manipulation of wavelengths associated with x-rays. The focusing optics can focus the x-rays onto a desired target so that a nanoplasma or nanofluorescent spot can be formed to have a diameter of less than 200 nm. Radiation from the nanoplasma or nanofluorescent spot can be examined, for example using a spectrometer, in order to perform a highly-selective material analysis of the desired target. Other applications include using the nanoplasma for nanoablation and/or nanodeposition processes.