Patents by Inventor Scott C. Dudley

Scott C. Dudley has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Tetracycline compositions
    Patent number: 11944634
    Abstract: The present invention relates to compositions, pharmaceutical compositions, and methods for preparing the same, comprising a tetracycline with improved stability and solubility. Some embodiments include a tetracycline with an excess of a divalent or trivalent cation.
    Type: Grant
    Filed: February 27, 2019
    Date of Patent: April 2, 2024
    Assignee: MELINTA SUBSIDIARY CORP.
    Inventors: David C. Griffith, Serge Boyer, Scott Hecker, Michael N. Dudley
  • Method and system for automated measurement of whole-wafer etch pit density in GaAs
    Patent number: 5008542
    Abstract: A method and system for measuring whole-wafer etch pit density (.rho..sub.D) is disclosed in which an etch GaAs wafer is tested for fractional transmission at a plurality of points over its surface. The fractional transmission (T) of light through the wafer is detected, amplified and fed to a computer where at least two points of transmission measurement are selected for calibration. From these measurements, together with an estimate of the average etch pit size (area), the values for fractional transmission in regions of low etch pit density T.sub.O and high etch pit density T.sub.E may be calculated, and used to convert transmission data directly to etch pit density (.rho..sub.
    Type: Grant
    Filed: December 20, 1989
    Date of Patent: April 16, 1991
    Assignee: The United States of America as represented by the Secretary of the Air Force
    Inventors: David C. Look, James S. Sewell, Millard G. Mier, John R. Sizelove, Dennis C. Walters, Scott C. Dudley