Abstract: A modular particle detecting device is disclosed for nonintrusive in-situ detection of particles passing through a sensing region. The device is particularly useful for microcontamination control in semiconductor processing environments, and includes, as separate components, a viewing unit and a sensing unit. The viewing unit has a detecting window and heated illuminating and discharge windows for condensation control. A fluid passage connectable to a flow line enables particle-carrying fluid to pass through a sensing region within the passage. The sensing unit has illuminating circuitry for providing light through the illuminating window to the sensing region, and has detecting circuitry to receive, through the detecting window, light scattered at the sensing region to thereby detect particles in fluid then at the sensing region without physical intrusion of the sensing unit into the sensing region.