Abstract: An apparatus is described for burn-in and/or functional testing of microelectronic circuits of unsingulated wafers. A large number of power, ground, and signal connections can be made to a large number of contacts on a wafer. The apparatus has a cartridge that allows for fanning-in of electric paths. A distribution board has a plurality of interfaces that are strategically positioned to provide a dense configuration. The interfaces are connected through flexible attachments to an array of first connector modules. Each one of the first connector modules can be independently connected to a respective one of a plurality of second connector modules, thereby reducing stresses on a frame of the apparatus. Further features include for example a piston that allows for tight control of forces exerted by terminals onto contacts of a wafer.

Abstract: An apparatus and a method for generating cursors in a multi-dimensional graphics display system uses line definition signals, each of which is representative of where along the horizontal display dimension one or more scan lines intersect a cursor to be presented. The apparatus includes a line definition memory for providing one or more line definition signals, and a line definition pointer circuit which responds to a scan line location by the vertical dimension, for selecting the line definition signal representative of the scan line. A generation circuit provides a cursor video signal at each horizontal location, as indicated by the selected line definition signal, where the represented scan line intersects the cursor to be presented.