Abstract: A spine measurement system comprises an optical measurement probe, one or more targets, a fluoroscope, and a remote station. A-P and lateral images of the spine are taken using the fluoroscope and provided to the remote station. The remote station includes computer vision that can identify endplates and pedicle screws in the spine. The computer vision in the remote station is further used to identify vertebra and bone landmarks of the spine. The remote station can generate quantitative measurement data such as Cobb angles and axial rotation of the spine from the fluoroscope images that correspond to the spine deformity. The optical measurement probe can send images of the spine with pedicle screw extenders extending from the pedicle screws to the remote station. The remotes station using computer vision can provide spine metrics in real-time by tracking position of the pedicle screw extenders.

Abstract: A spine measurement system comprises an optical measurement probe, one or more targets, a fluoroscope, and a remote station. A-P and lateral images of the spine are taken using the fluoroscope and provided to the remote station. The remote station includes computer vision that can identify endplates and pedicle screws in the spine. The computer vision in the remote station is further used to identify vertebra and bone landmarks of the spine. The remote station can generate quantitative measurement data such as Cobb angles and axial rotation of the spine from the fluoroscope images that correspond to the spine deformity. The optical measurement probe can send images of the spine with pedicle screw extenders extending from the pedicle screws to the remote station. The remotes station using computer vision can provide spine metrics in real-time by tracking position of the pedicle screw extenders.

Abstract: A spine measurement system comprises an optical measurement probe, one or more targets, a fluoroscope, and a remote station. A-P and lateral images of the spine are taken using the fluoroscope and provided to the remote station. The remote station includes computer vision that can identify endplates and pedicle screws in the spine. The computer vision in the remote station is further used to identify vertebra and bone landmarks of the spine. The remote station can generate quantitative measurement data such as Cobb angles and axial rotation of the spine from the fluoroscope images that correspond to the spine deformity. The optical measurement probe can send images of the spine with pedicle screw extenders extending from the pedicle screws to the remote station. The remotes station using computer vision can provide spine metrics in real-time by tracking position of the pedicle screw extenders.

Abstract: A spine measurement system comprises an optical measurement probe, one or more targets, a fluoroscope, and a remote station. A-P and lateral images of the spine are taken using the fluoroscope and provided to the remote station. The remote station includes computer vision that can identify endplates and pedicle screws in the spine. The computer vision in the remote station is further used to identify vertebra and bone landmarks of the spine. The remote station can generate quantitative measurement data such as Cobb angles and axial rotation of the spine from the fluoroscope images that correspond to the spine deformity. The optical measurement probe can send images of the spine with pedicle screw extenders extending from the pedicle screws to the remote station. The remotes station using computer vision can provide spine metrics in real-time by tracking position of the pedicle screw extenders.

Abstract: A spine measurement system comprises an optical measurement probe, one or more targets, a fluoroscope, and a remote station. A-P and lateral images of the spine are taken using the fluoroscope and provided to the remote station. The remote station includes computer vision that can identify endplates and pedicle screws in the spine. The computer vision in the remote station is further used to identify vertebra and bone landmarks of the spine. The remote station can generate quantitative measurement data such as Cobb angles and axial rotation of the spine from the fluoroscope images that correspond to the spine deformity. The optical measurement probe can send images of the spine with pedicle screw extenders extending from the pedicle screws to the remote station. The remotes station using computer vision can provide spine metrics in real-time by tracking position of the pedicle screw extenders.

Abstract: A spine measurement system comprises an optical measurement probe, one or more targets, a fluoroscope, and a remote station. A-P and lateral images of the spine are taken using the fluoroscope and provided to the remote station. The remote station includes computer vision that can identify endplates and pedicle screws in the spine. The computer vision in the remote station is further used to identify vertebra and bone landmarks of the spine. The remote station can generate quantitative measurement data such as Cobb angles and axial rotation of the spine from the fluoroscope images that correspond to the spine deformity. The optical measurement probe can send images of the spine with pedicle screw extenders extending from the pedicle screws to the remote station. The remotes station using computer vision can provide spine metrics in real-time by tracking position of the pedicle screw extenders.

Abstract: Various embodiments are directed at an apparatus for implementing electrical connectivity for testing of a semiconductor device. The apparatus comprises a probe head which comprises an upper guide plate and a lower guide plate, wherein the upper guide plate defines a plurality of first apertures, and the lower guide plate defines a plurality of second apertures in some embodiments. The apparatus further comprises a plurality of probes, wherein each of the plurality of probes passes through one of the plurality of first apertures on the upper guide plate and one of the plurality of second apertures on the lower guide plate, and at least one of the plurality of probes defines a buckled form after the at least one of the plurality of probes is finally assembled in the apparatus. The apparatus further comprises a template member to guide the plurality of probes.

Abstract: Disclosed is an improved probe having a spring portion which allows effective contact with a device under test without requiring a lower die portion. The probe includes a slot retention and placement portion, which provides for an improved approach for manufacturing arrangements of probes, where the slot retention and placement portions of the probe facilitate precise placement and alignment of the probes while not excessively increasing the cost or complexity of the probes and probe cards.

Abstract: Various embodiments are directed at an apparatus for implementing electrical connectivity for testing of a semiconductor device. The apparatus comprises a probe head which comprises an upper guide plate and a lower guide plate, wherein the upper guide plate defines a plurality of first apertures, and the lower guide plate defines a plurality of second apertures in some embodiments. The apparatus further comprises a plurality of probes, wherein each of the plurality of probes passes through one of the plurality of first apertures on the upper guide plate and one of the plurality of second apertures on the lower guide plate, and at least one of the plurality of probes defines a buckled form after the at least one of the plurality of probes is finally assembled in the apparatus. The apparatus further comprises a template member to guide the plurality of probes.

Abstract: A hybrid-buckling beam probe assembly is disclosed for probing semiconductor chips. The probe assembly includes an upper and lower die. A template is attached to a boss on the lower die. This template improves the reliability, time, and cost of assembling the hybrid-buckling beam probe assembly. In addition, the template facilitates on site repair and replacement of hybrid buckling beam probes that become damaged or worn during use. An optional spacer may be attached between the upper and lower dies. A template alignment tool is used to attach the template to the boss by means of adhesive strips.