Patents by Inventor Scott D. Conlin

Scott D. Conlin has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20090136953
    Abstract: A sample (103) containing a microorganism is divided into a first sample portion (107) and a second sample portion (113), a growth medium i(109, 114) is added to both sample portions and an antibiotic (110) is combined with the second sample portion. The two portions are incubated and then molecular analysis, such as a polymerase chain reaction, is performed on each of the first and second sample portions to determine the resistance or susceptibility of the microorganism to the antibiotic. The concentration of the microorganism prior to the incubation can be below the detection limit or above the detection limit. If of both the portions test positive for microbe growth, the microbe is resistant. If only the portion with the antibiotic tests negative for growth, then the microbe is susceptible.
    Type: Application
    Filed: November 12, 2008
    Publication date: May 28, 2009
    Applicant: MicroPhageTM Incorporated
    Inventors: Larry Gold, Scott D. Conlin
  • Publication number: 20080286757
    Abstract: A sample is tested for the presence of bacteria, such as in an automatic blood culturing apparatus. If bacteria are determined to be present, a bacteriophage-based bacteria identification process is performed to identify the bacteria present. A plurality of bacteria detection processes, such as a blood culture test and Gram stain test may be carried out prior to the bacteria identification process. A bacteriophage-based antibiotic resistance test or antibiotic susceptibility test is also conducted on the sample.
    Type: Application
    Filed: September 15, 2006
    Publication date: November 20, 2008
    Applicant: MicroPhage Incorporated
    Inventors: G. Scott Gaisford, John H. Wheeler, Jon C. Rees, Scott D. Conlin