Abstract: Systems and methods are provided through which one or more optimal operating parameters of an electronic device are determined by measuring the objective function of a combinatorial optimization algorithm, such as simulated annealing. For example, the operating parameters are stored in registers in the electronic device. The combinatorial optimization algorithm generates a value of each of the operating parameters of the electronic device. The objective function is measured by operating the electronic device using the value of the operating parameter, and recording at least one operating characteristic of the electronic device. Another value of the operating parameter is generated using the recorded operating characteristic. The process is repeated until an output of the combinatorial optimization algorithm indicates that for each operating parameter, the optimal value is determined.