Patents by Inventor Scott E. Stickel

Scott E. Stickel has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Web planarity gauge and method
    Patent number: 7423754
    Abstract: An apparatus for measuring web planarity includes a horizontal reference surface and a light source for projecting a light pattern onto the reference surface at an angle. A web is supported above the reference surface. An imaging device detects (1) positions on the reference plane of interception of discrete regions of the projected light pattern and (2) respective positions on the web of interception of the same discrete regions of the projected light pattern. The imaging device determines the vertical offset of the respective positions on the web as a function of differences in the detected positions on the reference plane and the respective detected positions on the web. A measure of non-planarity of the web is calculated based upon a comparison of a plurality of such vertical offsets from a plurality of detected positions of the web.
    Type: Grant
    Filed: January 11, 2007
    Date of Patent: September 9, 2008
    Assignee: Eastman Kodak Company
    Inventors: John P. Wysokowski, Scott E. Stickel, Alan R. Bentz
  • WEB PLANARITY GAUGE AND METHOD
    Publication number: 20080170237
    Abstract: An apparatus for measuring web planarity includes a horizontal reference surface and a light source for projecting a light pattern onto the reference surface at an angle. A web is supported above the reference surface. An imaging device detects (1) positions on the reference plane of interception of discrete regions of the projected light pattern and (2) respective positions on the web of interception of the same discrete regions of the projected light pattern. The imaging device determines the vertical offset of the respective positions on the web as a function of differences in the detected positions on the reference plane and the respective detected positions on the web. A measure of non-planarity of the web is calculated based upon a comparison of a plurality of such vertical offsets from a plurality of detected positions of the web.
    Type: Application
    Filed: January 11, 2007
    Publication date: July 17, 2008
    Inventors: John P. Wysokowski, Scott E. Stickel, Alan R. Bentz