Patents by Inventor Scott Eric Riddle

Scott Eric Riddle has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Fail Density-Based Clustering for Yield Loss Detection
    Publication number: 20210181253
    Abstract: A method for failed die clustering is provided that includes extracting a data set of failed die on a wafer from a wafer map for the wafer, determining a density parameter for clustering the failed die, removing false failures from the data set of failed die to generate a reduced data set of failed die, locating clusters of failed die in the reduced data set by executing a density-based spatial clustering of applications with noise (DBSCAN) algorithm with the density parameter, and applying a guard band to each located cluster.
    Type: Application
    Filed: November 12, 2020
    Publication date: June 17, 2021
    Inventors: Istvan Bauer, Michael Menne Haggerty, Scott Eric Riddle, Peter W. Kinghorn, Amit Nahar, Glenn Edward Schuette, Russell K. Kneupper