Abstract: A component subsystem and a method for authenticating the component subsystem. The component subsystem may be installed in a host device. The method can include an authentication protocol, wherein the host device sends a test voltage value to the component subsystem which, in turn, generates a test voltage based on the test voltage value. The test voltage is applied to a test cell that includes a wordline, a bitline, and a memory film. A response voltage is read from the bitline and compared to an expected value. If the response voltage matches the expected value, host device and/or component subsystem functionality is enabled. If the response voltage does not match the expected value, the host device and/or component subsystem functionality is disabled.

Abstract: A component subsystem and a method for authenticating the component subsystem. The component subsystem may be installed in a host device. The method can include an authentication protocol, wherein the host device sends a test voltage value to the component subsystem which, in turn, generates a test voltage based on the test voltage value. The test voltage is applied to a test cell that includes a wordline, a bitline, and a memory film. A response voltage is read from the bitline and compared to an expected value. If the response voltage matches the expected value, host device and/or component subsystem functionality is enabled. If the response voltage does not match the expected value, the host device and/or component subsystem functionality is disabled.

Abstract: A memory device authentication method that includes providing a memory device in a host device, and providing both an encryption algorithm, triggering the encryption algorithm during writing of data in the memory device, wherein the encryption algorithm allters the written data and generates a device altered data, then storing the written data in the memory device, running the encryption algorithm in the host device on the data written in the memory device and generating a host altered data, the verifying authenticity of the memory device by comparing the device altered data and the host alerted data. An authentication device and associated system that includes a host device that comprises a unit, a first encryption algorithm that is stored in the host device, and a second encryption algorithm, identical to the first encryption algorithm, that is permanently stored in a memory of the unit.

Abstract: A product identification method and associated system may include providing an identification element that corresponds to a consumable product, the identification element at least one of being portable by a user and being readable by a scanner; and at least one of marking information related to the consumable product on the identification element and storing information related to the consumable product in the identification element. Also, a product identification device may include an identification element, and information related to consumable product which is at least one of marked on the identification element and stored in the identification element.

Abstract: A data retrieval method and system are provided that include providing, in a device, a replaceable unit, storing usage data of the device in a database based on information stored in a CRUM used in the replaceable unit, providing access to the database to a user, and providing the usage data to the user. The user data is based on the device performing an operation and the information stored in the CRUM reflecting at least one data point reflecting the performed operation.

Abstract: A component subsystem and a method for authenticating the component subsystem. The component subsystem may be installed in a host device. The method can include an authentication protocol, wherein the host device sends a test voltage value to the component subsystem which, in turn, generates a test voltage based on the test voltage value. The test voltage is applied to a test cell that includes a wordline, a bitline, and a memory film. A response voltage is read from the bitline and compared to an expected value. If the response voltage matches the expected value, host device and/or component subsystem functionality is enabled. If the response voltage does not match the expected value, the host device and/or component subsystem functionality is disabled.