Patents by Inventor Scott Joseph Jewler
Scott Joseph Jewler has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 11688067Abstract: In one embodiment, an automated high-speed X-ray inspection system may generate a first X-ray image of an inspected sample at a first direction substantially orthogonal to a plane of the inspected sample. The first X-ray image may be a high-resolution grayscale image. The system may identify one or more elements of interest of the inspected sample based on the first X-ray image. The first X-ray image may include interfering elements that interfere with the one or more elements of interest in the first X-ray image. The system may determine one or more first features associated with respective elements of interest based on variations of grayscale values in the first X-ray images. The system may determine whether one or more defects are associated with the respective elements of interest based on the one or more first features associated with the element of interest.Type: GrantFiled: July 9, 2020Date of Patent: June 27, 2023Assignee: Bruker Nano, Inc.Inventors: David Lewis Adler, Scott Joseph Jewler, Freddie Erich Babian
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Patent number: 11662479Abstract: In one embodiment, a computing system may access design data of a printed circuit board to be produced by a manufacturing process. The system may determine one or more corrections for the design data of the printed circuit board based on one or more correction rules for correcting one or more parameters associated with the printed circuit board. The system may automatically adjust one or more of the parameters associated with the design data of the printed circuit board based on the one or more corrections. The adjusted parameters may be associated with an impedance of the printed circuit board. The one or more corrections may cause the impendence of the printed circuit board to be independent from layer thickness variations of the printed circuit board to be produced by the manufacturing process.Type: GrantFiled: May 20, 2021Date of Patent: May 30, 2023Assignee: Bruker Nano, Inc.Inventors: David Lewis Adler, Freddie Erich Babian, Scott Joseph Jewler
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Patent number: 11651492Abstract: In one embodiment, an X-ray inspection system may nondestructively inspect a printed circuit board to measure a number of dimensions at a number of pre-determined locations of the printed circuit board. The X-ray inspection system may generate a data set for the printed circuit board based on the measured dimensions. The X-ray inspection system may calculate one or more drilling values based on the data set of the printed circuit board. The X-ray inspection system may provide, to a drilling machine, instructions for drilling a number of plated-through vias based on the calculated drilling values for the printed circuit board.Type: GrantFiled: July 9, 2020Date of Patent: May 16, 2023Assignee: Bruker Nano, Inc.Inventors: David Lewis Adler, Scott Joseph Jewler, Freddie Erich Babian, Andrew George Reid, Benjamin Thomas Adler
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Patent number: 11615533Abstract: In one embodiment, an X-ray inspection system may access a first set of X-ray images of one or more first samples that are labeled as being non-conforming. The system may adjust a classification algorithm based on the first set of X-ray images. The classification algorithm may classify samples into conforming or non-conforming categories based on an analysis of corresponding X-ray images. The system may analyze a second set of X-ray images of a number of second samples using the adjusted classification algorithm. The second samples may be previously inspected samples that have been classified as conforming by the classification algorithm during a previous analysis before the classification algorithm is adjusted. The system may identify one or more of the second samples from the second set of X-ray images. Each identified second sample may be classified as non-conforming by the adjusted classification algorithm.Type: GrantFiled: July 9, 2020Date of Patent: March 28, 2023Assignee: Bruker Nano, Inc.Inventors: David Lewis Adler, Scott Joseph Jewler, Douglas A. Chrissan
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Patent number: 11430118Abstract: In one embodiment, an X-ray inspection system may capture one or more X-ray images for samples of interest processed by a first tool. The X-ray inspection system may be inline with the first tool and have an inspection speed of 300 mm2 per minute or greater. The system may determine, in real-time, metrology information related to the samples of interest based on the X-ray images. The metrology information may indicate that a sample parameter associated with the samples of interest is outside of a pre-determined range. The system may provide instructions or data to one or more of the first tool or one or more second tools to adjust process parameters associated with the respective tools based on metrology information. The adjusted process parameters may reduce a processing error probability, of the respective tool for processing subsequent samples, related to the sample parameter being outside of the pre-determined range.Type: GrantFiled: July 9, 2020Date of Patent: August 30, 2022Assignee: Bruker Nano, Inc.Inventors: David Lewis Adler, Scott Joseph Jewler
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Publication number: 20210279878Abstract: In one embodiment, a computing system may access design data of a printed circuit board to be produced by a manufacturing process. The system may determine one or more corrections for the design data of the printed circuit board based on one or more correction rules for correcting one or more parameters associated with the printed circuit board. The system may automatically adjust one or more of the parameters associated with the design data of the printed circuit board based on the one or more corrections. The adjusted parameters may be associated with an impedance of the printed circuit board. The one or more corrections may cause the impendence of the printed circuit board to be independent from layer thickness variations of the printed circuit board to be produced by the manufacturing process.Type: ApplicationFiled: May 20, 2021Publication date: September 9, 2021Inventors: David Lewis Adler, Freddie Erich Babian, Scott Joseph Jewler
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Patent number: 11042981Abstract: In one embodiment, a computing system may access design data of a printed circuit board to be produced by a first manufacturing process. The system may analyze the design data of the printed circuit board using a machine-learning model, wherein the machine-learning model is trained based on X-ray inspection data associated with the first manufacturing process. The system may automatically determine one or more corrections for the design data of the printed circuit board based on the analysis result by the machine-learning model.Type: GrantFiled: July 9, 2020Date of Patent: June 22, 2021Assignee: SVXR, Inc.Inventors: David Lewis Adler, Freddie Erich Babian, Scott Joseph Jewler
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Publication number: 20210012054Abstract: In one embodiment, a computing system may access design data of a printed circuit board to be produced by a first manufacturing process. The system may analyze the design data of the printed circuit board using a machine-learning model, wherein the machine-learning model is trained based on X-ray inspection data associated with the first manufacturing process. The system may automatically determine one or more corrections for the design data of the printed circuit board based on the analysis result by the machine-learning model.Type: ApplicationFiled: July 9, 2020Publication date: January 14, 2021Inventors: David Lewis Adler, Freddie Erich Babian, Scott Joseph Jewler
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Publication number: 20210012499Abstract: In one embodiment, an automated high-speed X-ray inspection system may generate a first X-ray image of an inspected sample at a first direction substantially orthogonal to a plane of the inspected sample. The first X-ray image may be a high-resolution grayscale image. The system may identify one or more elements of interest of the inspected sample based on the first X-ray image. The first X-ray image may include interfering elements that interfere with the one or more elements of interest in the first X-ray image. The system may determine one or more first features associated with respective elements of interest based on variations of grayscale values in the first X-ray images. The system may determine whether one or more defects are associated with the respective elements of interest based on the one or more first features associated with the element of interest.Type: ApplicationFiled: July 9, 2020Publication date: January 14, 2021Inventors: David Lewis Adler, Scott Joseph Jewler, Freddie Erich Babian
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Publication number: 20210010954Abstract: In one embodiment, an X-ray inspection system may access a first set of X-ray images of one or more first samples that are labeled as being non-conforming. The system may adjust a classification algorithm based on the first set of X-ray images. The classification algorithm may classify samples into conforming or non-conforming categories based on an analysis of corresponding X-ray images. The system may analyze a second set of X-ray images of a number of second samples using the adjusted classification algorithm. The second samples may be previously inspected samples that have been classified as conforming by the classification algorithm during a previous analysis before the classification algorithm is adjusted. The system may identify one or more of the second samples from the second set of X-ray images. Each identified second sample may be classified as non-conforming by the adjusted classification algorithm.Type: ApplicationFiled: July 9, 2020Publication date: January 14, 2021Inventors: David Lewis Adler, Scott Joseph Jewler, Douglas A. Chrissan
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Publication number: 20210011177Abstract: In one embodiment, an X-ray inspection system may capture one or more X-ray images for samples of interest processed by a first tool. The X-ray inspection system may be inline with the first tool and have an inspection speed of 300 mm2 per minute or greater. The system may determine, in real-time, metrology information related to the samples of interest based on the X-ray images. The metrology information may indicate that a sample parameter associated with the samples of interest is outside of a pre-determined range. The system may provide instructions or data to one or more of the first tool or one or more second tools to adjust process parameters associated with the respective tools based on metrology information. The adjusted process parameters may reduce a processing error probability, of the respective tool for processing subsequent samples, related to the sample parameter being outside of the pre-determined range.Type: ApplicationFiled: July 9, 2020Publication date: January 14, 2021Inventors: David Lewis Adler, Scott Joseph Jewler
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Publication number: 20210014979Abstract: In one embodiment, an X-ray inspection system may nondestructively inspect a printed circuit board to measure a number of dimensions at a number of pre-determined locations of the printed circuit board. The X-ray inspection system may generate a data set for the printed circuit board based on the measured dimensions. The X-ray inspection system may calculate one or more drilling values based on the data set of the printed circuit board. The X-ray inspection system may provide, to a drilling machine, instructions for drilling a number of plated-through vias based on the calculated drilling values for the printed circuit board.Type: ApplicationFiled: July 9, 2020Publication date: January 14, 2021Inventors: David Lewis Adler, Scott Joseph Jewler, Freddie Erich Babian, Andrew George Reid, Benjamin Thomas Adler