Abstract: A device and method for inspecting glass containers and particularly the finish of glass containers is provided. The glass container inspection device includes a rotator rotates a glass container located in an inspection location at least 360 degrees. A first laser source produces a first laser beam which is directed towards the inspection location to form an angle of incidence with the selected glass container being greater than or equal to a critical angle for producing internal reflection of the first laser beam within the selected glass container. A camera is directed at the inspection location to detect light that escapes from the selected glass container as a result of the internally reflected laser beam intersecting a defect in the selected glass container.

Abstract: A device and method for inspecting glass containers and particularly the finish of glass containers is provided. The glass container inspection device includes a rotator rotates a glass container located in an inspection location at least 360 degrees. A first laser source produces a first laser beam which is directed towards the inspection location to form an angle of incidence with the selected glass container being greater than or equal to a critical angle for producing internal reflection of the first laser beam within the selected glass container. A camera is directed at the inspection location to detect light that escapes from the selected glass container as a result of the internally reflected laser beam intersecting a defect in the selected glass container.

Abstract: Methods and apparatus for performing an accelerated lifetime test on a photovoltaic device are provided. The method can include positioning a first photovoltaic device in a first holder adjacent to a light guide such that a transparent surface of the photovoltaic device faces the light guide, directing light emitted from a first light source into the light guide, and redirecting the light emitted from the first light source within the light guide to illuminate the transparent surface of the photovoltaic device.

Abstract: Methods for isolating thin film photovoltaic cells on a superstrate are provided. The method includes focusing a laser beam onto a first surface of the superstrate to remove a thin film stack positioned on a second surface of the superstrate, and directing the laser beam across the first surface of the superstrate to form an isolation scribe that is substantially free from the thin film stack. The thin film stack can include a transparent conductive oxide layer on the second surface, an n-type window layer on the transparent conductive oxide layer, and an absorber layer on the n-type window layer. The laser beam can have a laser wavelength of about 370 nm or less, and/or can have a laser wavelength such that the transparent conductive oxide layer absorbs at least about 80% of the laser beam at the laser wavelength.