Abstract: Aspects of the present disclosure propose techniques for testing a network on chip (NoC). An exemplary method may generally include generating, at a source node of the NoC, a first plurality of packets according to a first pre-defined pattern of a plurality of pre-defined patterns, wherein each pre-defined pattern is designed to provoke transients in the NoC, generating, at the source node of the NoC, a second plurality of packets according to the first pre-defined pattern of the plurality of pre-defined patterns, generating the transients in the NoC by transmitting the first plurality of packets and thereafter transmitting the second plurality of packets, and verifying at least one of the first plurality of packets or the second plurality of packets are successfully received at a destination node of the NoC despite the generated transients.

Abstract: An industrial process control field device includes a process variable transducer configured to sense or control a process variable. Field device circuitry is configured to couple to the process variable transducer and communicate information related to the process variable to another location. The field device circuitry includes an optical isolator having transmit circuitry on a first side of a galvanic isolation configured to transmit an optical signal which is pulsed on and off across the isolation. Receive circuitry is located on a second side of galvanic isolation and configured to receive the optical signal with an optical sensor. The optical sensor enters an “on” state when it receives a pulse and is otherwise in an “off” state. The receive circuitry provides a secondary side output based upon the received optical signal. The receive circuitry enters in a low power state when the optical sensor is in the “off” state.

Abstract: An industrial process control field device includes a process variable transducer configured to sense or control a process variable. Field device circuitry is configured to couple to the process variable transducer and communicate information related to the process variable to another location. The field device circuitry includes an optical isolator having transmit circuitry on a first side of a galvanic isolation configured to transmit an optical signal which is pulsed on and off across the isolation. Receive circuitry is located on a second side of galvanic isolation and configured to receive the optical signal with an optical sensor. The optical sensor enters an “on” state when it receives a pulse and is otherwise in an “off” state. The receive circuitry provides a secondary side output based upon the received optical signal. The receive circuitry enters in a low power state when the optical sensor is in the “off” state.