Abstract: Aspects of the present disclosure propose techniques for testing a network on chip (NoC). An exemplary method may generally include generating, at a source node of the NoC, a first plurality of packets according to a first pre-defined pattern of a plurality of pre-defined patterns, wherein each pre-defined pattern is designed to provoke transients in the NoC, generating, at the source node of the NoC, a second plurality of packets according to the first pre-defined pattern of the plurality of pre-defined patterns, generating the transients in the NoC by transmitting the first plurality of packets and thereafter transmitting the second plurality of packets, and verifying at least one of the first plurality of packets or the second plurality of packets are successfully received at a destination node of the NoC despite the generated transients.