Patents by Inventor Scott Matthew Gulas

Scott Matthew Gulas has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11209459
    Abstract: An electronic device test system includes a contactor having probe pairs with first and second conductive probes to couple to a respective conductive feature of a packaged electronic device or wafer die region. The system also includes a test circuit having a voltage source to provide a common mode voltage signal; a first buffer with a first input coupled to an output of the voltage source, an output coupled to a first conductive probe of a first probe pair, and a second input coupled to a second conductive probe of the first probe pair; and a second buffer with a first input coupled to the output of the voltage source, an output coupled to a first conductive probe of a second probe pair, and a second input coupled to a second conductive probe of the second probe pair.
    Type: Grant
    Filed: January 28, 2020
    Date of Patent: December 28, 2021
    Assignee: TEXAS INSTRUMENTS INCORPORATED
    Inventors: Scott Matthew Gulas, Zebulan Keith Thomas
  • Publication number: 20200264212
    Abstract: An electronic device test system includes a contactor having probe pairs with first and second conductive probes to couple to a respective conductive feature of a packaged electronic device or wafer die region. The system also includes a test circuit having a voltage source to provide a common mode voltage signal; a first buffer with a first input coupled to an output of the voltage source, an output coupled to a first conductive probe of a first probe pair, and a second input coupled to a second conductive probe of the first probe pair; and a second buffer with a first input coupled to the output of the voltage source, an output coupled to a first conductive probe of a second probe pair, and a second input coupled to a second conductive probe of the second probe pair.
    Type: Application
    Filed: January 28, 2020
    Publication date: August 20, 2020
    Applicant: Texas Instruments Incorporated
    Inventors: Scott Matthew Gulas, Zebulan Keith Thomas