Patents by Inventor Scott Messina

Scott Messina has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Laser desorption, ablation, and ionization system for mass spectrometry analysis of samples including organic and inorganic materials
    Patent number: 11769656
    Abstract: Systems and methods for sample analysis include applying, using a first laser source, a first beam to a sample to desorb organic material from a location of the sample and ionizing the desorbed organic material using a second laser source to generate ionized organic material. The ionized organic material is then analyzed using a mass spectrometer. A second beam from the first laser is then applied to the sample to ablate inorganic material from the location of the sample. The ablated inorganic material is then ionized using the second laser source to generate ionized inorganic material. The mass spectrometer is then used to analyze the ionized inorganic material. During analysis, one or more images of the sample may also be captured and linked to the collected analysis data.
    Type: Grant
    Filed: November 1, 2021
    Date of Patent: September 26, 2023
    Assignee: Exum Instruments
    Inventors: Jeffrey Williams, Stephen Strickland, Neal Wostbrock, Oleg Maltsev, Matthew McGoogan, Scott Messina
  • LASER DESORPTION, ABLATION, AND IONIZATION SYSTEM FOR MASS SPECTROMETRY ANALYSIS OF SAMPLES INCLUDING ORGANIC AND INORGANIC MATERIALS
    Publication number: 20220059333
    Abstract: Systems and methods for sample analysis include applying, using a first laser source, a first beam to a sample to desorb organic material from a location of the sample and ionizing the desorbed organic material using a second laser source to generate ionized organic material. The ionized organic material is then analyzed using a mass spectrometer. A second beam from the first laser is then applied to the sample to ablate inorganic material from the location of the sample. The ablated inorganic material is then ionized using the second laser source to generate ionized inorganic material. The mass spectrometer is then used to analyze the ionized inorganic material. During analysis, one or more images of the sample may also be captured and linked to the collected analysis data.
    Type: Application
    Filed: November 1, 2021
    Publication date: February 24, 2022
    Inventors: Jeffrey Williams, Stephen Strickland, Neal Wostbrock, Oleg Maltsev, Matthew McGoogan, Scott Messina
  • Laser desorption, ablation, and ionization system for mass spectrometry analysis of samples including organic and inorganic materials
    Patent number: 11164734
    Abstract: Systems and methods for sample analysis include applying, using a first laser source, a first beam to a sample to desorb organic material from a location of the sample and ionizing the desorbed organic material using a second laser source to generate ionized organic material. The ionized organic material is then analyzed using a mass spectrometer. A second beam from the first laser is then applied to the sample to ablate inorganic material from the location of the sample. The ablated inorganic material is then ionized using the second laser source to generate ionized inorganic material. The mass spectrometer is then used to analyze the ionized inorganic material. During analysis, one or more images of the sample may also be captured and linked to the collected analysis data.
    Type: Grant
    Filed: April 11, 2019
    Date of Patent: November 2, 2021
    Assignee: Exum Instruments
    Inventors: Jeffrey Williams, Stephen Strickland, Neal Wostbrock, Oleg Maltsev, Matthew McGoogan, Scott Messina
  • LASER DESORPTION, ABLATION, AND IONIZATION SYSTEM FOR MASS SPECTROMETRY ANALYSIS OF SAMPLES INCLUDING ORGANIC AND INORGANIC MATERIALS
    Publication number: 20200328072
    Abstract: Systems and methods for sample analysis include applying, using a first laser source, a first beam to a sample to desorb organic material from a location of the sample and ionizing the desorbed organic material using a second laser source to generate ionized organic material. The ionized organic material is then analyzed using a mass spectrometer. A second beam from the first laser is then applied to the sample to ablate inorganic material from the location of the sample. The ablated inorganic material is then ionized using the second laser source to generate ionized inorganic material. The mass spectrometer is then used to analyze the ionized inorganic material. During analysis, one or more images of the sample may also be captured and linked to the collected analysis data.
    Type: Application
    Filed: April 11, 2019
    Publication date: October 15, 2020
    Applicant: Exum Instruments
    Inventors: Jeffrey Williams, Stephen Strickland, Neal Wostbrock, Oleg Maltsev, Matthew McGoogan, Scott Messina